Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware
Sadi, Mehdi, He, Yi, Li, Yanjing, Alam, Mahabubul, Kundu, Satwik, Ghosh, Swaroop, Bahrami, Javad, Karimi, Naghmeh
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Voltage Tuning for Reliable Computation in Emerging Resistive Memories
Mayahinia, Mahta, Jafari, Atousa, Tahoori, Mehdi B.
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis
Ganji, Mona, Saikiran, Marampally, Chen, Degang
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration
Ahmed, Soyed Tuhin, Tahoori, Mehdi B.
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
FSMx: Finite State Machine Extraction from Flattened Netlist With Application to Security
Kibria, Rasheed, Farzana, Nusrat, Farahmandi, Farimah, Tehranipoor, Mark
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems
Dave, Shail, Marchisio, Alberto, Hanif, Muhammad Abdullah, Guesmi, Amira, Shrivastava, Aviral, Alouani, Ihsen, Shafique, Muhammad
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs
Pavlidis, Antonios, Faehn, Eric, Louerat, Marie-Minerve, Stratigopoulos, Haralampos-G.
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing
Farayola, Praise O., Bruce, Isaac, Chaganti, Shravan K., Sheikh, Abalhassan, Ravi, Srivaths, Chen, Degang
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Innovative Practices Track: High Speed Test Fabric
Nelapatla, Bala Tarun, Singhal, Rahul, Daub, Michael, Stanojevics, Zoran
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Innovative Practices Track: Test of 3D ICs & Chiplets
Goel, Sandeep Kumar, Pendharkar, Sandeep, Liu, Chunsheng
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
FIFO Topology Aware Stalling for Accelerating Coverage Convergence of Stalling Regressions
Chatterjee, Debarshi, Lathigara, Parth, Dhodhi, Siddhanth, Parsons, Chad
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding
Innovation Practices Track: Silicon Telemetry for Dependability
Su, Fei, Crosher, Stephen, Matteucci, Andrea, Zou, Yuwen
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)
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Conference Proceeding