SEU Evaluation of Hardened-by-Replication Software in RISC- V Soft Processor
De Sio, Corrado, Azimi, Sarah, Portaluri, Andrea, Sterpone, Luca
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Zero-Overhead Protection for CNN Weights
Burel, Stephane, Evans, Adrian, Anghel, Lorena
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses
Palumbo, Alessandro, Cassano, Luca, Reviriego, Pedro, Bianchi, Giuseppe, Ottavi, Marco
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
A Fault Tolerant soft-core obtained from an Interleaved-Multi- Threading RISC- V microprocessor design
Barbirotta, Marcello, Cheikh, Abdallah, Mastrandrea, Antonio, Menichelli, Francesco, Vigli, Francesco, Olivieri, Mauro
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
The Impact of Faults on DNNs: A Case Study
Malekzadeh, Elaheh, Rohbani, Nezam, Lu, Zhonghai, Ebrahimi, Masoumeh
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Non-invasive I2C Hardware Trojan Attack Vector
Khelif, Mohamed Amine, Lorandel, Jordane, Romain, Olivier
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Fine-Grained Vulnerability Analysis of Resource Constrained Neural Inference Accelerators
Corneliou, Panayiotis, Nikolaou, Panagiota, Michael, Maria K., Theocharides, Theocharis
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Analyzing the Single Event Upset Vulnerability of Binarized Neural Networks on SRAM FPGAs
Souvatzoglou, Ioanna, Papadimitriou, Athanasios, Sari, Aitzan, Vlagkoulis, Vasileios, Psarakis, Mihalis
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Post-Quantum Cryptography: Challenges and Opportunities for Robust and Secure HW Design
Bellizia, Davide, Mrabet, Nadia El, Fournaris, Apostolos P., Pontie, Simon, Regazzoni, Francesco, Standaert, Francois-Xavier, Tasso, Elise, Valea, Emanuele
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Zoom-In Feature for Storage-Based Logic Built-In Self-Test
Pomeranz, Irith
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models
Kaja, Endri, Gerlin, Nicolas, Vaddeboina, Mounika, Rivas, Luis, Prebeck, Sebastian, Han, Zhao, Devarajegowda, Keerthikumara, Ecker, Wolfgang
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Usability-based Cross-Layer Reliability Evaluation of Image Processing Applications
Bolchini, Cristiana, Cassano, Luca, Mazzeo, Andrea, Miele, Antonio
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Testing and Reliability Enhancement of Security Primitives
Hasan Anik, Toufiq, Danger, Jean-Luc, Diankha, Omar, Ebrahimabadi, Mohammad, Frisch, Christoph, Guilley, Sylvain, Karimi, Naghmeh, Pehl, Michael, Takarabt, Sofiane
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults
Narang, Anuraag, Venu, Balaji, Khursheed, Saqib, Harrod, Peter
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
An Aging-Aware CMOS SRAM Structure Design for Boolean Logic In-Memory Computing
Chang, Wei, Chen, Yu-Guang, Huang, Po-Yeh, Li, Jin-Fu
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
JÄNES: A NAS Framework for ML-based EDA Applications
Selg, Hardi, Jenihhin, Maksim, Ellervee, Peeter
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders
Gao, Zhen, Wang, Ruize, Du, Haoyu, Reviriego, Pedro
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
An In-Depth Vulnerability Analysis of RISC-V Micro-Architecture Against Fault Injection Attack
Kazemi, Zahra, Norollah, Amin, Kchaou, Afef, Fazeli, Mahdi, Hely, David, Beroulle, Vincent
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding
RADPlace: A Timing-aware RAdiation-Hardening Detailed Placement Scheme Satisfying TMR Spacing Constraints
Georgakidis, Christos, Lilitsis, Iordanis, Stanimeropoulos, Georgios, Sotiriou, Christos
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
Published in 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (06.10.2021)
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Conference Proceeding