Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Wu, Lizhou, Rao, Siddharth, Taouil, Mottaqiallah, Marinissen, Erik Jan, Kar, Gouri Sankar, Hamdioui, Said
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs
Cote, Jean-Francois, Kassab, Mark, Janiszewski, Wojciech, Rodrigues, Ricardo, Meier, Reinhard, Kaczmarek, Bartosz, Orlando, Peter, Eide, Geir, Rajski, Janusz, Colon-Bonet, Glenn, Mysore, Naveen, Yin, Ya, Pant, Pankaj
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Digital Design Techniques for Dependable High Performance Computing
Azimi, Sarah, Sterpone, Luca
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
FAT: Training Neural Networks for Reliable Inference Under Hardware Faults
Zahid, Ussama, Gambardella, Giulio, Fraser, Nicholas J., Blott, Michaela, Vissers, Kees
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Machine Intelligence for Efficient Test Pattern Generation
Roy, Soham, Millican, Spencer K., Agrawal, Vishwani D.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage
Saikiran, Marampally, Ganji, Mona, Chen, Degang
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Functional Criticality Classification of Structural Faults in AI Accelerators
Chaudhuri, Arjun, Talukdar, Jonti, Su, Fei, Chakrabarty, Krishnendu
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Advanced Outlier Detection Using Unsupervised Learning for Screening Potential Customer Returns
Hu, Hanbin, Nguyen, Nguyen, He, Chen, Li, Peng
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Cross-PUF Attacks on Arbiter-PUFs through their Power Side-Channel
Kroeger, Trevor, Cheng, Wei, Guilley, Sylvain, Danger, Jean-Luc, Karimi, Naghmeh
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
SPARTA: A Laser Probing Approach for Trojan Detection
Stern, Andrew, Mehta, Dhwani, Tajik, Shahin, Farahmandi, Farimah, Tehranipoor, Mark
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns
Mhamdi, S., Girard, P., Virazel, A., Bosio, A., Ladhar, A.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated Circuits
Sanabria-Borbon, A., Jayasankaran, N. G., Lee, S., Sanchez-Sinencio, E., Hu, J., Rajendran, J.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Online Fault Detection in ReRAM-Based Computing Systems by Monitoring Dynamic Power Consumption
Liu, Mengyun, Chakrabarty, Krishnendu
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution
Huang, Qicheng, Fang, Chenlei, Shawn Blanton, R. D.
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Hardware IP Protection Using Logic Encryption and Watermarking
Karmakar, Rajit, Chattopadhyay, Santanu
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Security Preserving Integration and Resynthesis of Reconfigurable Scan Networks
Lylina, Natalia, Atteya, Ahmed, Wang, Chih-Hao, Wunderlich, Hans-Joachim
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts
Pandey, Sujay, Liao, Zhiwei, Nandi, Shreyas, Gupta, Sanya, Natarajan, Suriyaprakash, Sinha, Arani, Singh, Adit, Chatterjee, Abhijit
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Unsupervised Root-Cause Analysis for Integrated Systems
Pan, Renjian, Zhang, Zhaobo, Li, Xin, Chakrabarty, Krishnendu, Gu, Xinli
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Rapid PLL Monitoring By A Novel min-MAX Time-to-Digital Converter
Chen, Wei-Hao, Hsu, Chu-Chun, Huang, Shi-Yu
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding