Search Results - "2020 IEEE International Conference On Artificial Intelligence Testing (AITest)" :: K.UTB vyhledávací portál

Coverage based testing for V&V and Safety Assurance of Self-driving Autonomous Vehicles: A Systematic Literature Review

by Tahir, Zaid, Alexander, Rob
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Evaluating Validity of Synthetic Data in Perception Tasks for Autonomous Vehicles

by Talwar, Deepak, Guruswamy, Sachin, Ravipati, Naveen, Eirinaki, Magdalini
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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An Agency-Directed Approach to Test Generation for Simulation-based Autonomous Vehicle Verification

by Chance, Greg, Ghobrial, Abanoub, Lemaignan, Severin, Pipe, Tony, Eder, Kerstin
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Dealing with Robustness of Convolutional Neural Networks for Image Classification

by Arcaini, Paolo, Bombarda, Andrea, Bonfanti, Silvia, Gargantini, Angelo
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Manifold-based Test Generation for Image Classifiers

by Byun, Taejoon, Vijayakumar, Abhishek, Rayadurgam, Sanjai, Cofer, Darren
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Identifying and Generating Missing Tests using Machine Learning on Execution Traces

by Utting, Mark, Legeard, Bruno, Dadeau, Frederic, Tamagnan, Frederic, Bouquet, Fabrice
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Message from the General Chair

by Wotawa, Franz
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Message from the Program Co-Chairs

Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Effectiveness of dataset reduction in testing machine learning algorithms

by Chandrasekaran, Jaganmohan, Feng, Huadong, Lei, Yu, Kacker, Raghu, Kuhn, D. Richard
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Testing acoustic scene classifiers using Metamorphic Relations

by Moreira, Diogo, Furtado, Ana Paula, Nogueira, Sidney
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Automated identification of metamorphic test scenarios for an ocean-modeling application

by Hiremath, Dilip J., Claus, Martin, Hasselbring, Wilhelm, Rath, Willi
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Controlled time series generation for automotive software-in-the-loop testing using GANs

by Parthasarathy, Dhasarathy, Backstrom, Karl, Henriksson, Jens, Einarsdottir, Solrun
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Automation of Datamorphic Testing

by Zhu, Hong, Bayley, Ian, Liu, Dongmei, Zheng, Xiaoyu
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Neural Network Classification for Improving Continuous Regression Testing

by Marijan, Dusica, Gotlieb, Arnaud, Sapkota, Abhijeet
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Cluster-Based Parallel Testing Using Semantic Analysis

by Landing, Cristina, Tahvili, Sahar, Haggren, Hugo, Langkvis, Martin, Muhammad, Auwn, Loufi, Amy
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Ontology-driven Security Testing of Web Applications

by Bozic, Josip, Li, Yihao, Wotawa, Franz
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Improving Automated GUI Testing by Learning to Avoid Infeasible Tests

by Walkinshaw, Neil
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Accuracy Measurement of Deep Neural Network Accelerator via Metamorphic Testing

by Wang, Chaojin, Shen, Jian, Fang, Chunrong, Guan, Xiangsheng, Wu, Kaitao, Wang, Jiang
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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An Image Quality Assessment Method for Surface Defect Inspection

by Lin, Hsien-I, Lin, Po-Yi
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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Building a Classification System for Failed Test Reports: Industrial Experience

by Pavlov, Sergey, Gromova, Anna, Itkin, Iosif, Mamedov, Murad, Libkov, Alexander, Novikov, Andrey, Tsymbalov, Evgenii
Published in 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) (01.08.2020)

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