Understanding ESD Characteristics of GGNMOS in Bulk FinFET Technology
Chen, Wen-Chieh, Chen, Shih-Hung, Hellings, Geert, Chiarella, Thomas, Chen, Jie, Subramanian, Sujith, Siew, Yong Kong, Linten, Dimitri, Groeseneken, Guido
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
A Thin Film Storage Device to Characterize the CDM Event Distribution of a Process
Lauderdale, Matt, Onyegam, Emmanuel, Smith, Brad, Yater, Jane, Ruth, Scott
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Efficient ESD Generator Modeling Using Reinforcement Learning
Kumar, Akhilesh, Yang, En-Cih, Shih, Ming-Chih, Li, Ying-Shiun, Chuang, Wen-Tze, Chang, Norman
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Analytical Model and Verification Algorithm to Prevent Injection Induced Latchup Failures
Marreiro, David, Malobabic, Slavica, Vashchenko, Vladislav
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Latchup Test Structure Optimization in Advanced CMOS Technologies
Get full text
Conference Proceeding
Increased Latch-up Susceptibility of ICs Using Reverse Body Bias
Vora, Sandeep, Stockinger, Michael, Rosenbaum, Elyse
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
A physical finite difference model of a forward biased diode using SPICE
Get full text
Conference Proceeding
Novel ESD Compact Modeling Methodology Using Machine Learning Techniques
Liang, Wei, Yang, Xuejiao, Loiseau, Alain, Mitra, Souvick, Gauthier, Robert
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
An Experimentally Verified Methodology for Calculating Coaxial Cable Loss Effects on CDM Waveforms
Ensaf, Peyman, Maloney, Timothy J.
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Clarification and Countermeasures of Electrostatic Discharge in High-Pressure Spray Cleaning During Flat-Panel Display Manufacturing
Seike, Yoshiyuki, Fukuoka, Yasuaki, Mori, Tatsuo, Segawa, Taishi, Kobayashi, Yoshinori, Miyachi, Keiji
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Impact of Alternative CDM Methods on HV ESD Protections Behavior
Di Biccari, Leonardo, Boroni, Andrea, Castelnovo, Alessandro, Zullino, Lucia, Cerati, Lorenzo, Wolf, Heinrich, Weber, Johannes, Andreini, Antonio
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Ultrafast RVS as an Efficient Method to Measure Oxide Breakdown in the EOS and ESD Time Domain
Van Beek, Simon, Simicic, Marko, Franco, Jacopo, Chen, Shih-Hung, Linten, Dimitri
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Transmission Line Pulse (TLP) Statistical Characterization Approach
Merlo, L., Di Biccari, L., Castelnovo, A., Cerati, L., Boroni, A., Martino, A., Andreini, A.
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Pitfalls for Transient Analysis with VF-TLP
Smedes, Theo, Coenen, Mart, Sluiter, Sander, Cappon, Paul
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Charged Device Model (CDM) and Capacitive Coupled Transmission Line Pulsing (CC-TLP) Stress Severity Study on RF IC's
Abessolo-Bidzo, Dolphin, Weber, Johannes, Kiriliouk, Victoria, Wolf, Heinrich, Verwoerd, Sheela, Jirutkova, Ellen
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Balancing the Trade-off Between Performance and Mis-trigger Immunity in Active Feedback-based High-voltage Tolerant Power Clamps
Ayling, Alex, Salcedo, Javier, Parthasarathy, Srivatsan, Hajjar, Jean-Jacques, Rosenbaum, Elyse
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
ESD Characterization and Modeling of Cascoded, Silicided FETs in a 22nm FDSOI Technology
Loiseau, Alain, Yang, Xuejiao, Nath, Anindya, Mitra, Souvick, Forguites, John, Fortney, Michael
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding
Open-relay Tester Capacitance Parasitic Induced Product Level HBM Failure with ESD Proven IP in FinFET Technology
Hung, Tao-Yi, Chu, Li-Wei, Lee, Paul, Chang, Wei-Chao, Tsai, Ming-Fu, Lin, Wun-Jie, Lee, Jam-Wem, Wang, Chris, Chen, Kuo-Ji, Song, Ming-Hsiang
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Get full text
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding