Critical review of U.S. Military environmental stress screening (ESS) handbook
Nga Man Li, Das, Diganta
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Reliability of corner staked surface mount packages
Deng Yun Chen, Osterman, Michael
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Tools for analysis of accelerated life and degradation test data
Smith, Reuel, Modarres, Mohammad
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Thin MLCC (multi-layer ceramic capacitor) reliability evaluation using an accelerated ramp voltage test
Scarpulla, John, Ayvazian, Talin, Buell, Walter, Campbell, Megan, Dubitsky, Andrei, Lin, Rebecca, Martin, Wayne, Moss, Steven, Nuccio, Scott, Yarbrough, Allyson, Young, Jeremy
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Reliability of conformal coated surface mount packages
Deng Yun Chen, Osterman, Michael
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Accelerated stress & reliability testing for software and cyber-physical systems
Straub, Jeremy
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Accelerated life testing of a commercial door handle
Stasiak, Michael, Hyde, Brian
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
HASS Rapid Change-Over Process
Clayton, Derik, Stuckey, Julie
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding
Challenges in setting up and analyzing a multi-stress accelerated test
Cohen, Gerry, Mclinn, James
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
Published in 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) (2016)
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Conference Proceeding