Search Results - "2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)" :: K.UTB vyhledávací portál

Application level investigation of system-level ESD-induced soft failures

by Vora, Sandeep, Rui Jiang, Vasudevan, Shobha, Rosenbaum, Elyse
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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PNP-eSCR ESD protection device with tunable trigger and holding voltage for high voltage applications

by Da-Wei Lai, Shuang Zhao, Jian Gao, Smedes, Theo
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Gun tests of a USB3 host controller board

by Notermans, Guido, Ritter, Hans-Martin, Laue, Burkhard, Seider, Stefan
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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2015 Friendship Award in Recognition of RCJ 2014 Best Paper Award/Japan

by Takahashi, Katsuyuki, Goto, Akira, Yamaguchi, Shinichi, Saito, Tomokatsu, Sakamoto, Kensuke, Nagata, Hidemi
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Workshop and panel discussions: A.1 should the industry council address adequate IEC 6100-4-2 levels?

by Notermans, Guido, Pommerenke, David, Gossner, Harald
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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2014 Outstanding Paper

by Gaertner, Reinhold, Stadler, Wolfgang, Niemesheim, Josef, Hilbricht, Oliver
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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2014 Best Paper and Best Student Paper Award

by Mertens, Robert, Thomson, Nicholas, Xiu, Yang, Rosenbaum, Elyse
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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ESD protection design in a-IGZO TFT technologies

by Scholz, M., Steudel, S., Myny, K., Chen, S., Boschke, R., Hellings, G., Linten, D.
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Predictive high voltage ESD device design methodology

by Jian-Hsing Lee, Iyer, Natarajan Mahadeva, Jain, Ruchil, Prabhu, Manjunatha
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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An on-chip combo clamp for surge and universal ESD protection in bulk FinFET technology

by Ming-Fu Tsai, Jen-Chou Tseng, Chung-Yu Huang, Tzu-Heng Chang, Kuo-Ji Chen, Ming-Hsiang Song
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Predict the product specific CDM stress using measurement-based models of CDM discharge heads

by zur Nieden, Friedrich, Esmark, Kai, Seidl, Stefan, Gartner, Reinhold
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Physics of SOA degradation phenomena in power transistors under ESD conditions

by Jian-Hsing Lee, Iyer, Natarajan Mahadeva, Haojun Zhang, Prabhu, Manjunatha, Li, Patrick Cao, Guowei Zhang, Tsung-Che Tsai
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Spice modelling flow for ESD simulation of CMOS ICs

by Langguth, Gernot, Ille, Adrien
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Charged cable-system ESD event

by Tamminen, Pasi, Viheriakoski, Toni
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Improving CDM measurements with frequency domain specifications

by Barth, Jon, Henry, Leo G., Richner, John
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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HV ESD diodes investigation under vf-TLP stresses: TCAD approach

by Di Biccari, Leonardo, Cerati, Lorenzo, Zullino, Lucia, Andreini, Antonio
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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ESD power clamp with adjustable trigger voltage for RF power amplifier integrated circuit

by Chaudhry, Iqbal, Peachey, Nathaniel
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Case study of DPI robustness of a MOS-SCR structure for automotive applications

by Yang Xiu, Farbiz, Farzan, Salman, Akram, Yue Zu, Dissegna, Mariano, Boselli, Gianluca, Rosenbaum, Elyse
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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EDA approaches in identifying latchup risks

by Khazhinsky, Michael, Domanski, Krzysztof, Quax, Guido, Ruth, Scott, Farbiz, Farzan, Trivedi, Nitesh, Gossner, Harald
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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Novel insights into the power-off and power-on transient performance of power-rail ESD clamp circuit

by Guangyi Lu, Yuan Wang, Yize Wang, Jian Cao, Xing Zhang
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)

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