Highly-scalable disruptive reading scheme for Gb-scale SPRAM and beyond
Takemura, R, Kawahara, T, Ono, K, Miura, K, Matsuoka, H, Ohno, H
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Architectural design for next generation heterogeneous memory systems
Bivens, Alan, Dube, Parijat, Franceschini, Michele, Karidis, John, Lastras, Luis, Tsao, Mickey
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Through-silicon-via technology for 3D integration
Dukovic, J, Ramaswami, S, Pamarthy, S, Yalamanchili, R, Rajagopalan, N, Sapre, K, Cao, Z, Ritzdorf, T, Wang, Y, Eaton, B, Ding, R, Hernandez, M, Naik, M, Mao, D, Tseng, J, Cui, D, Mori, G, Fulmer, P, Sirajuddin, K, Hua, J, Xia, S, Erickson, D, Beica, R, Young, E, Kusler, P, Kulzer, R, Oemardani, S, Dai, H, Xu, X, Okazaki, M, Dotan, K, Yu, C, Lazik, C, Tran, J, Luo, L
Published in 2010 IEEE International Memory Workshop (2010)
Published in 2010 IEEE International Memory Workshop (2010)
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Conference Proceeding
Non-volatile Spin-Transfer Torque RAM (STT-RAM): An analysis of chip data, thermal stability and scalability
Driskill-Smith, A, Watts, S, Apalkov, D, Druist, D, Tang, X, Diao, Z, Luo, X, Ong, A, Nikitin, V, Chen, E
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
On Carbon doping to improve GeTe-based Phase-Change Memory data retention at high temperature
Beneventi, G B, Gourvest, E, Fantini, A, Perniola, L, Sousa, V, Maitrejean, S, Bastien, J C, Bastard, A, Fargeix, A, Hyot, B, Jahan, C, Nodin, J F, Persico, A, Blachier, D, Toffoli, A, Loubriat, S, Roule, A, Lhostis, S, Feldis, H, Reimbold, G, Billon, T, De Salvo, B, Larcher, L, Pavan, P, Bensahel, D, Mazoyer, P, Annunziata, R, Boulanger, F
Published in 2010 IEEE International Memory Workshop (2010)
Published in 2010 IEEE International Memory Workshop (2010)
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Conference Proceeding
In-depth analysis of 3D Silicon nanowire SONOS memory characteristics by TCAD simulations
Nowak, E, Hubert, A, Perniola, L, Ernst, T, Ghibaudo, G, Reimbold, G, De Salvo, B, Boulanger, F
Published in 2010 IEEE International Memory Workshop (2010)
Published in 2010 IEEE International Memory Workshop (2010)
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Conference Proceeding
Lifetime and wearout current modeling of ultra-thin oxide antifuse bitcells using transient characterization
Deloge, M, Allard, B, Candelier, P, Damiens, J, Le-Roux, E, Rafik, M
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Charge loss in TANOS devices caused by Vt sensing measurements during retention
Park, H, Bersuker, G, Gilmer, D, Lim, K Y, Jo, M, Hwang, H, Padovani, A, Larcher, L, Pavan, P, Taylor, W, Kirsch, P D
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Design of TAS-MRAM prototype for NV embedded memory applications
Chaudhuri, Sumanta, Weisheng Zhao, Klein, Jacques-Olivier, Chappert, Claude, Mazoyer, Pascale
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Demonstration of Conductive Bridging Random Access Memory (CBRAM) in Logic CMOS Process
Gopalan, C, Yi Ma, Gallo, T, Wang, J, Runnion, E, Saenz, J, Koushan, F, Hollmer, S
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Future evolution of memory subsystem in mobile applications
Youngjoon Choi, Hyojin Jeong, Hyunbo Kim
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Impact of material composition on the write performance of phase-change memory devices
Boniardi, M, Ielmini, D, Lacaita, A L, Redaelli, A, Pirovano, A, Tortorelli, I, Allegra, M, Magistretti, M, Bresolin, C, Erbetta, D, Modelli, A, Varesi, E, Pellizzer, F, Bez, R
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
Study of electron and hole injection statistics of BE-SONOS NAND Flash
Hang-Ting Lue, Tzu-Hsuan Hsu, Sheng-Chih Lai, Chen, Y J, Chen, K F, Chester Lo, Huang, I J, Han, T T, Chen, M S, Lu, W P, Chen, K C, Chang, C S, Liaw, M H, Kuang-Yeu Hsieh, Chih-Yuan Lu
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding
A 40nm low power SRAM retention circuit with PVT-aware self-refreshing virtual VDD regulation
Dray, C, Badereddine, N, Chanussot, C
Published in 2010 IEEE International Memory Workshop (01.05.2010)
Published in 2010 IEEE International Memory Workshop (01.05.2010)
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Conference Proceeding