by Hu, Jiuning, Ruan, Xiulin, Jiang, Zhigang, Chen, Yong P
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Osten, W, Ferreras Paz, V, Frenner, K, Schuster, T, Bloess, H
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Moeck, Peter, Loader, Marius, Abdel-Hafiez, Mahmoud, Hietschold, Michael
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Vurpillot, F, Gruber, M, Duguay, S, Cadel, E, Deconihout, B
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Kaja, K, Chevalier, N, Mariolle, D, Bertin, F, Feuillet, G, Chabli, A
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Kisielowski, C, Specht, P, Alloyeau, D, Erni, R, Ramasse, Q
Published in AIP conference proceedings (01.01.2009)

by Hopstaken, M J P, Cabral Jr, C, Pfeiffer, D, Molella, C, Ronsheim, P
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Venugopal, Archana, Pirkle, Adam, Wallace, Robert M, Colombo, Luigi, Vogel, Eric M
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Nutsch, A, Beckhoff, B, Bedana, G, Borionetti, G, Codegoni, D, Grasso, S, Guerinoni, G, Leibold, A, Muller, M, Otto, M, Pfitzner, L, Polignano, M-L, De Simone, D, Frey, L
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Nutsch, A, Bucourt, S, Grandin, T, Lazareva, I, Pfitzner, L
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Geiss, Roy H, Read, David T, Alers, Glenn B, Graham, Rebekah L
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (15.05.2009)

by Gelb, Jeff, Yun, Wenbing, Feser, Michael, Tkachuk, Andrei
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Tian, Jifa, Cai, Jinming, Hui, Chao, Li, Chen, Tian, Yuan, Shen, Chengmin, Gao, Hongjun
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (15.05.2009)

by Postek, Michael T, Vladar, Andras E, Ming, Bin
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Li, Fuhe, Anderson, Scott
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Giubertoni, D, Pepponi, G, Beckhoff, B, Hoenicke, P, Gennaro, S, Meirer, F, Ingerle, D, Steinhauser, G, Fried, M, Petrik, P, Parisini, A, Reading, M A, Streli, C, Van Den Berg, J A, Bersani, M
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Windover, Donald, Gil, David L, Henins, Albert, Cline, James P
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Kamineni, V K, Raymond, M, Bersch, E J, Doris, B B, Diebold, A C
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Fu, Joseph, Chu, Wei, Dixson, Ronald, Orji, George, Vorburger, Theodore
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)

by Geist, Jon, Afridi, Muhammad
Published in 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (01.01.2009)