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Determination of physical parameters for HfO2/SiOx/TiN MOSFET gate stacks by electrical characterization and reverse modeling
Monaghan, S., Hurley, P.K., Cherkaoui, K., Negara, M.A., Schenk, A.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Conference Proceeding
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A12O3 optimization for Charge Trap memory application
Scozzari, C., Albini, G., Alessandri, M., Amoroso, S., Bacciaglia, P., Del Vitto, A., Ghidini, G.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Using a cell manipulation biochip to investigate the adhesion characteristics of single mammalian cells
Cellere, G., Borgo, M., De Toni, A., Bandiera, L., Santoni, L., Biondato, L., Paccagnella, A., Lorenzelli, L.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P., Crupi, F., Iannaccone, G., Giusi, G., Pace, C., Simoen, E., Claeys, C.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Channel Hot-Carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
Amat, E., Kauerauf, T., Degraeve, R., De Keersgieter, A., Rodriguez, R., Nafria, M., Aymerich, X., Groeseneken, G.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Threshold voltage in ultra thin FDSOI CMOS : Advanced triple interface model and experimental devices
Mazellier, J.P., Andrieu, F., Faynot, O., Brevard, L., Buj, C., Cristoloveanu, S., Le Tiec, Y., Deleonibus, S.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Impact of isotropic plasma etching on channel Si surface roughness measured by AFM and on NMOS inversion layer mobility
Dupre, C., Ernst, T., Borel, S., Morand, Y., Descombes, S., Guillaumot, B., Garros, X., Becu, S., Mescot, X., Ghibaudo, G., Deleonibus, S.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Conference Proceeding
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Schottky barrier height modulation by Arsenic Dopant segregation
Urban, C., Zhao, Q.-T., Sandow, C., Muller, M., Breuer, U., Mantl, S.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Simulation of self-heating effects in 30nm gate length FinFET
Braccioli, M., Curatola, G., Yang, Y., Sangiorgi, E., Fiegna, C.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Electrical Characterization and Compact Modeling of MOSFET body effect
Quenette, V., Lemoigne, P., Rideau, D., Clerc, R., Ciampolini, L., Minondo, M., Tavernier, C., Jaouen, H.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Simulation of strain enhanced variability in nMOSFETs
Xingsheng Wang, Binjie Cheng, Roy, S., Asenov, A.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Dielectric characteristics of amorphous and crystalline BaHfO3 high-k layers on TiN for memory capacitor applications
Lupina, G., Kozlowski, G., Dudek, P., Dabrowski, J., Wenger, C., Lippert, G., Mussig, H.-J.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Substrate bias effect on Ge pMOSFETs with and without halo
Simoen, E., Voroshazi, E., Mitard, J., Eneman, G., Brunco, D.P., De Jaeger, B., Meuris, M.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes
Rajasekharan, B., Salm, C., Hueting, R.J.E., Hoang, T., Schmitz, J.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Channel backscattering characteristics of high performance germanium pMOSFETs
Dobbie, A., De Jaeger, B., Meuris, M., Whall, T.E., Parker, E.H.C., Leadley, D.R.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Unified model for low-field electron mobility in bulk and SOI-MOSFETs with different substrate orientations and its application to quantum drift-diffusion simulation
Silvestri, L., Reggiani, S., Gnani, E., Gnudi, A., Baccarani, G.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Feasibility of SIO2/Al2O3 tunnel dielectric for future Flash memories generations
Padovani, A., Larcher, L., Verma, S., Pavan, P., Majhi, P., Kapur, P., Parat, K., Bersuker, G., Saraswat, K.
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
Published in 2008 9th European Workshop on Ultimate Integration on Silicon (01.03.2008)
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Conference Proceeding