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The Universality of NBTI Relaxation and its Implications for Modeling and Characterization
Grasser, T., Gos, W., Sverdlov, V., Kaczer, B.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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On the Physical Mechanism of NBTI in Silicon Oxynitride p-MOSFETs: Can Differences in Insulator Processing Conditions Resolve the Interface Trap Generation versus Hole Trapping Controversy?
Mahapatra, S., Ahmed, K., Varghese, D., Islam, A.E., Gupta, G., Madhav, L., Saha, D., Alam, M.A.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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SEU and SET Modeling and Mitigation in Deep Submicron Technologies
Mavis, D.G., Eaton, P.H.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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A Comprehensive Model for Hot Carrier Degradation in LDMOS Transistors
Moens, P., Mertens, J., Bauwens, F., Joris, P., De Ceuninck, W., Tack, M.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Data Retention Characterization of Phase-Change Memory Arrays
Gleixner, B., Pirovano, A., Sarkar, J., Ottogalli, F., Tortorelli, E., Tosi, M., Bez, R.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Single Event Upsets in a 130 nm Hardened Latch Design Due to Charge Sharing
Amusan, O.A., Stemberg, A.L., Witulski, A.F., Bhuva, B.L., Black, J.D., Baze, M.P., Massengill, L.W.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Effects of Lateral Charge Spreading on the Reliability of TANOS (TaN/AlO/SiN/Oxide/Si) NAND Flash Memory
Changseok Kang, Jungdal Choi, Jaesung Sim, Changhyun Lee, Yoocheol Shin, Jintaek Park, Jongsun Sel, Sanghun Jeon, Youngwoo Park, Kinam Kim
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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OLED Device Operational Lifetime: Insights and Challenges
Xia, S.C., Kwong, R.C., Adamovich, V.I., Weaver, M.S., Brown, J.J.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Understanding SRAM High-Temperature-Operating-Life NBTI: Statistics and Permanent vs Recoverable Damage
Haggag, A., Anderson, G., Parihar, S., Burnett, D., Abeln, G., Higman, J., Moosa, M.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Time Dependent Dielectric Breakdown Characteristics of Low-k Dielectric (SiOC) Over a Wide Range of Test Areas and Electric Fields
Jinyoung Kim, Ogawa, E.T., McPherson, J.W.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Progressive Breakdown Characteristics of High-K/Metal Gate Stacks
Bersuker, G., Chowdhury, N., Young, C., Heh, D., Misra, D., Choi, R.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Time and voltage dependence of dielectric charging in RF MEMS capacitive switches
Herfst, R.W., Steeneken, P.G., Schmitz, J.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Modeling of Interconnect Dielectric Lifetime Under Stress Conditions and New Extrapolation Methodologies for Time-Dependent Dielectric Breakdown
Haase, G.S., McPherson, J.W.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Evaluation of SCR-Based ESD Protection Devices in 90nm and 65nm CMOS Technologies
Di Sarro, J., Chatty, K., Gauthier, R., Rosenbaum, E.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Dielectric Breakdown in High-K Gate Dielectrics - Mechanism and Lifetime Assessment
Okada, K., Ota, H., Nabatame, T., Toriumi, A.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Bias Stress Effects in Organic Thin Film Transistors
Tse Nga Ng, Chabinyc, M.L., Street, R.A., Salleo, A.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Reliability of High-Power IGBT Modules for Traction Applications
Ciappa, M., Castellazzi, A.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Temperature and Voltage Dependent RF Degradation Study in Algan/gan HEMTs
Coffie, R., Chen, Y., Smorchkova, I.P., Heying, B., Gambin, V., Sutton, W., Chou, Y.-C., Luo, W.-B., Wojtowicz, M., Oki, A.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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The Effect of Metal Area and Line Spacing on TDDB Characteristics of 45nm Low-k SiCOH Dielectrics
Chen, F., McLaughlin, P., Gambino, J., Wu, E., Demarest, J., Meatyard, D., Shinosky, M.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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