Local-property analysis for modeling of gate insulator materials
Kentaro Doi, Nakamura, K., Tachibana, A.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
NanoCMOS devices at the end and beyond the roadmap
Deleonibus, S., De Salvo, B., Clavelier, L., Ernst, T., Faynot, O., Poiroux, T., Vinet, M.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
High-resolution Rutherford backscattering spectroscopy for Nano-CMOS applications
Kimura, K., Zhao Ming, Nakajima, K., Suzuki, M.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Parasitics effects in multi gate MOSFETs
Manoj, C.R., Mangal, A., Rao, V.R., Tsutsui, K., Iwai, H.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Hf-based high-k gate dielectrics - Scalability for hp45 node and beyond
Yasuo Nara, Seiji Inumiya, Kamiyama, S., Kunio Nakamura
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
First-principles evaluations of dielectric constants
Nakamura, J., Wakui, S., Natori, A.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Ultra-shallow junction and high-k dielectric for Nano CMOS
Tsutsui, K., Sasaki, Y., Majima, K., Fukagawa, Y., Aiba, I., Higaki, R., Cheng-Guo Jin, Ito, H., Mizuno, B., Jin-Aun Ng, Tachi, K., Jaeyeol Song, Shiino, Y., Kakushima, K., Ahmet, P., Iwai, H.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
32nm technology node Double-Gate SOI MOSFET using SiO2 gate stacks
Sangiorgi, E., Barin, N., Braccioli, M., Fiegna, C.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Mobility enhancement in (110)-oriented ultra-thin-body single-gate and double-gate SOI MOSFETs
Hiramoto, T., Gen Tsutsui, Saitoh, M., Nagumo, T., Saraya, T.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Evaluation of phosphorus diffusion in the confined nano-wire under the influence of Si/SiO2 interface
Seike, A., Sano, I., Yamada, K., Ohdomari, I.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
New findings in nano-scale interface physics and their relations to nano-CMOS technologies
Shiraishi, K., Akasaka, Y., Torii, K., Nakayama, T., Miyazaki, S., Nakaoka, T., Watanabe, H., Ohmori, K., Ahmet, P., Chikyow, T., Nara, Y., Yamada, K.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Research and development of transistor structure in nano-scale region
Koyanagi, M., Yamada, Y., Park, M., Fukushima, T., Tanaka, T.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding
Influences of annealing conditions on flatband voltage properties using continuously workfunction-tuned metal electrodes
Ohmori, K., Ahmet, P., Shiraishi, K., Watanabe, H., Akasaka, Y., Yamabe, K., Yoshitake, M., Chang, K.-S., Green, M.L., Yamada, K., Chikyow, T.
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
Published in 2006 International Workshop on Nano CMOS (01.01.2006)
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Conference Proceeding