High productivity single wafer radical oxidation system
Yokota, Y., Agus Tjandra, Kai Ma, Sanaka, M., Moritz, K., Sharma, R.S., Forstner, H.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Ni/sub 2/Si and NiSi formation by low temperature soak and spike RTPs
Eun-Ha Kim, HaIi Forstner, H., Foad, M., Tam, N., Ramamurthy, S., Griffin, P.B., Plummer, J.D.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Ultra low temperature NISI processing
Hunter, A., Tanasa, C., Ramanujam, R., Tang, A., Tam, N., Ramachandran, B., Achutharaman, R., Ramamurthy, S., Ranish, J.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Synthesis and control of ultra thin gate oxides for the 90 and 65 nm nodes
Shepard, J.F.Jr, Chou, A., Chudzik, M., Collins, C., Freiler, M., Wei He, Kirsch, P., Loebl, A., Mo, R., Ronsheim, P., Rottenkolber, E., Wenjuan Zhu
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Superior spike annealing performance in 65 nm source/drain extension engineering
Ching I Li, Chin Cheng Chien, Huang, K.T., Po Yuan Chen, Hsiang Ying Wang, Tzou, S.F., Chen, S., Lin, J., Fu, T., Riyang Tandjaja, Sundar Ramamurthy, Chung, E., Chuang, J., Wen-Shan Chen
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
The FDTD computation of electromagnetic wave scattering from surfaces
Kang Fu, Pei-feng Hsu
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Awards
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors
(2005)
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Conference Proceeding
RTP Conference Achievement Awards
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors
(2005)
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Conference Proceeding
Advanced thermal processing of semiconductor materials in the msec-range
Skorupa, W., Yankov, R.A., Voelskow, M., Anwand, W., Panknin, D., McMahon, R.A., Smith, M., Gebel, T., Rebohle, L., Fendler, R., Hentsch, W.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Pyrometry for laser annealing
Adams, B., Mayur, A., Hunter, A., Ramanujam, R.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
CMOS challenges of keeping up with Moore's Law
Orlowski, M.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding
Physical aspects of particle deposition in RTP
Schmid, P., Frigge, S., Huelsmann, Th, Nadig, B., Nenyei, Z., Reisdorf, R.
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
Published in 2005 13th International Conference on Advanced Thermal Processing of Semiconductors (2005)
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Conference Proceeding