The effect of frequency on the lifetime of a surface micromachined microengine driving a load
Tanner, D.M., Miller, W.M., Eaton, W.P., Irwin, L.W., Peterson, K.A., Dugger, M.T., Senft, D.C., Smith, N.F., Tangyunyong, P., Miller, S.L.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Impact of screening of latent defects at electrical test on the yield-reliability relation and application to burn-in elimination
Van der Pol, J.A., Ooms, E.R., Van 't Hof, T., Kuper, F.G.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Latchup in CMOS technology
Hargrove, M.J., Voldman, S., Gauthier, R., Brown, J., Duncan, K., Craig, W.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Constant current charge-to-breakdown: Still a valid tool to study the reliability of MOS structures?
Nigam, T., Degraeve, R., Groeseneken, G., Heyns, M.M., Maes, H.E.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Extended data retention process technology for highly reliable flash EEPROMs of 10/sup 6/ to 10/sup 7/ W/E cycles
Arai, F., Maruyama, T., Shirota, R.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Enhanced dielectric breakdown lifetime of the copper/silicon nitride/silicon dioxide structure
Takeda, K.-I., Hinode, K., Oodake, I., Oohashi, N., Yamaguchi, H.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Failure modes in surface micromachined microelectromechanical actuators
Miller, S.L., Rodgers, M.S., LaVigne, G., Sniegowski, J.J., Clews, P., Tanner, D.M., Peterson, K.A.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Switching behavior of the soft breakdown conduction characteristic in ultra-thin (<5 nm) oxide MOS capacitors
Miranda, E., Sune, J., Rodriguez, R., Nafria, M., Aymerich, X.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Elimination of bond-pad damage through structural reinforcement of intermetal dielectrics
Saran, M., Cox, R., Martin, C., Ryan, G., Kudoh, T., Kanasugi, M., Hortaleza, J., Ibnabdeljalil, M., Murtuza, M., Capistrano, D., Roderos, R., Macaraeg, R.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
High-current transmission line pulse characterization of aluminum and copper interconnects for advanced CMOS semiconductor technologies
Voldman, S., Gauthier, R., Reinhart, D., Morrisseau, K.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
A new algorithm for transforming exponential current ramp breakdown distributions into constant current TDDB space, and the implications for gate oxide Q/sub BD/ measurement methods
Dumin, N.A.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding
Effect of H/sub 2/O partial pressure and temperature during Ti sputtering on texture and electromigration in AlSiCu-Ti-TiN-Ti metallization
Yoshida, T., Hashimoto, S., Mitsushima, Y., Ohwaki, T., Taga, Y.
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
Published in 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) (1998)
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Conference Proceeding