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Search Results - "齐浩淳 张小玲 谢雪松 赵利 陈成菊 吕长志"
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The expression correction of transistor current gain and its application in reliability assessment
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齐浩淳 张小玲 谢雪松 赵利 陈成菊 吕长志
Published in
Journal of semiconductors
(01.09.2014)
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Storage life of power switching transistors based on performance degradation data
by
齐浩淳 张小玲 谢雪松 吕长志 陈成菊 赵利
Published in
Journal of semiconductors
(01.04.2014)
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engineering
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extrapolation
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semiconductor devices
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