Effect of trapped charge accumulation on the retention of charge trapping memory
Jin, Rui (锐金), Liu, Xiaoyan (晓彦 刘), Du, Gang (刚杜), Kang, Jinfeng (晋锋 康), Han, Ruqi (汝琦 韩)
Published in Journal of semiconductors (01.12.2010)
Published in Journal of semiconductors (01.12.2010)
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