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Pattern imprinting in deep sub-micron static random access memories induced by total dose irradiation
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郑齐文 余学峰 崔江维 郭旗 任迪远 丛忠超 周航
Published in
Chinese physics B
(01.10.2014)
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Journal Article
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physics
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background noise
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construction
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deep sub-micron
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devices
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gates
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irradiation
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English
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AUTh Library subscriptions: IOP Publishing
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