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Security test method and system for programmable logic device packaging module
LIU WEI, ZHAO FEI, LI CHUNJING, XING XIWANG, AN PENGWEI, QU TIANRUN, YAN YUHANG, LIANG XIAO, CHEN PENG, WANG YINGCHAO, ZHANG RONG, WU JUNSHUANG, JI WEIWEI, CHEN JUNYING
Year of Publication 10.06.2022
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Year of Publication 10.06.2022
Patent