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A robust and simple two-mode digital calibration technique for pipelined ADC
Yin, Xiumei (秀梅 殷), Zhao, Nan (南赵), Sekedi, Bomeh Kobenge (梅玻), Yang, Huazhong (华中 杨)
Published in Journal of semiconductors (01.03.2011)
Published in Journal of semiconductors (01.03.2011)
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Journal Article