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Search Results - "刘进 陈永光 谭志良 杨洁 张希军 王振兴"
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Understanding the failure mechanisms of microwave bipolar transistors caused by electrostatic discharge
by
刘进 陈永光 谭志良 杨洁 张希军 王振兴
Published in
Journal of semiconductors
(01.10.2011)
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Journal Article
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engineering
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physics
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accumulation effect
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bipolar transistors
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devices
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electrostatic discharges
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esd
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English
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IOPscience platform
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