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Positive gate-bias temperature instability of ZnO thin-film transistor
by
刘玉荣 苏晶 黎沛涛 姚若河
Published in
Chinese physics B
(01.06.2014)
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Journal Article
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physics
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gate-bias instability
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instability
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mathematical analysis
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physical sciences
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physics
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physics, multidisciplinary
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English
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IOP Electronic Journals
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