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"何红宇 郑学仁"
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Analytical drain current model for amorphous IGZO thin-film transistors in above-threshold regime
by
何红宇 郑学仁
Published in
Journal of semiconductors
(01.07.2011)
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Journal Article
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engineering
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physics
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amorphous ingaznoxide
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charge
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density
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drains
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mathematical analysis
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mathematical models
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English
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Institute of Physics (IOP) Publishing Journals
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