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High-k Gate Dielectric Films Studied by Extremely Asymmetric X-ray Diffraction and X-ray Photoelectron Spectroscopy
Ito, Yuki, Akimoto, Koichi, Yoshida, Hironori, Emoto, Takashi, Kobayashi, Daisuke, Hirose, Kazuyuki
Published in Journal of physics. Conference series (01.10.2007)
Published in Journal of physics. Conference series (01.10.2007)
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