Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement
Sun, Guo-Sheng (国胜 孙), Liu, Xing-Fang (兴防 刘), Wu, Hai-Lei (海雷 吴), Yan, Guo-Guo (果果 闫), Dong, Lin (林董), Zheng, Liu (柳郑), Zhao, Wan-Shun (万顺 赵), Wang, Lei (雷王), Zeng, Yi-Ping (一平 曾), Li, Xi-Guang (锡光 李), Wang, Zhan-Guo (占国 王)
Published in Chinese physics B (01.03.2011)
Published in Chinese physics B (01.03.2011)
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Journal Article
Multi-wafer 3C-SiC thin films grown on Si (100) in a vertical HWLPCVD reactor
Yan, Guoguo (果果 闫), Sun, Guosheng (国胜 孙), Wu, Hailei (海雷 吴), Wang, Lei (雷王), Zhao, Wanshun (万顺 赵), Liu, Xingfang (兴昉 刘), Zeng, Yiping (一平 曾), Wen, Jialiang (家良 温)
Published in Journal of semiconductors (01.06.2011)
Published in Journal of semiconductors (01.06.2011)
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Journal Article