Silver Ink Formulations for Sinter-free Printing of Conductive Films
Black, Kate, Singh, Jetinder, Mehta, Danielle, Sung, Sarah, Sutcliffe, Christopher. J., Chalker, Paul. R.
Published in Scientific reports (09.02.2016)
Published in Scientific reports (09.02.2016)
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Journal Article
Review on Non-Volatile Memory with High -k Dielectrics: Flash for Generation Beyond 32 nm
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Book Review
Oxides for Rectenna Technology
Mitrovic, Ivona Z., Almalki, Saeed, Tekin, Serdar B., Sedghi, Naser, Chalker, Paul R., Hall, Stephen
Published in Materials (01.09.2021)
Published in Materials (01.09.2021)
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Journal Article
Electrical Properties and Interfacial Studies of HfxTi1–xO2 High Permittivity Gate Insulators Deposited on Germanium Substrates
Lu, Qifeng, Mu, Yifei, Roberts, Joseph, Althobaiti, Mohammed, Dhanak, Vinod, Wu, Jingjin, Zhao, Chun, Zhao, Ce, Zhang, Qian, Yang, Li, Mitrovic, Ivona, Taylor, Stephen, Chalker, Paul
Published in Materials (02.12.2015)
Published in Materials (02.12.2015)
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Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement
Zhao, Chun, Zhao, Ce Zhou, Lu, Qifeng, Yan, Xiaoyi, Taylor, Stephen, Chalker, Paul R
Published in Materials (13.10.2014)
Published in Materials (13.10.2014)
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Journal Article
The 2018 GaN power electronics roadmap
Amano, H, Baines, Y, Beam, E, Borga, Matteo, Bouchet, T, Chalker, Paul R, Charles, M, Chen, Kevin J, Chowdhury, Nadim, Chu, Rongming, De Santi, Carlo, De Souza, Maria Merlyne, Decoutere, Stefaan, Di Cioccio, L, Eckardt, Bernd, Egawa, Takashi, Fay, P, Freedsman, Joseph J, Guido, L, Häberlen, Oliver, Haynes, Geoff, Heckel, Thomas, Hemakumara, Dilini, Houston, Peter, Hu, Jie, Hua, Mengyuan, Huang, Qingyun, Huang, Alex, Jiang, Sheng, Kawai, H, Kinzer, Dan, Kuball, Martin, Kumar, Ashwani, Lee, Kean Boon, Li, Xu, Marcon, Denis, März, Martin, McCarthy, R, Meneghesso, Gaudenzio, Meneghini, Matteo, Morvan, E, Nakajima, A, Narayanan, E M S, Oliver, Stephen, Palacios, Tomás, Piedra, Daniel, Plissonnier, M, Reddy, R, Sun, Min, Thayne, Iain, Torres, A, Trivellin, Nicola, Unni, V, Uren, Michael J, Van Hove, Marleen, Wallis, David J, Wang, J, Xie, J, Yagi, S, Yang, Shu, Youtsey, C, Yu, Ruiyang, Zanoni, Enrico, Zeltner, Stefan, Zhang, Yuhao
Published in Journal of physics. D, Applied physics (25.04.2018)
Published in Journal of physics. D, Applied physics (25.04.2018)
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Constant Photocurrent Method to Probe the Sub‐Bandgap Absorption in Wide Bandgap Semiconductor Films: The Case of α‐Ga2O3
Nicol, David, Reynolds, Stephen, Barr, Kristopher, Roberts, Joseph W., Jarman, John J., Chalker, Paul R., Massabuau, Fabien C.‐P.
Published in physica status solidi (b) (01.05.2024)
Published in physica status solidi (b) (01.05.2024)
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Journal Article
Ni/Au contacts to corundum α-Ga2O3
Massabuau, Fabien C.-P., Adams, Francesca, Nicol, David, Jarman, John C., Frentrup, Martin, Roberts, Joseph W., O’Hanlon, Thomas J., Kovács, Andras, Chalker, Paul R., Oliver, R. A.
Published in Japanese Journal of Applied Physics (01.06.2023)
Published in Japanese Journal of Applied Physics (01.06.2023)
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Journal Article
A high speed PE-ALD ZnO Schottky diode rectifier with low interface-state density
Jin, Jidong, Zhang, Jiawei, Shaw, Andrew, Kudina, Valeriya N, Mitrovic, Ivona Z, Wrench, Jacqueline S, Chalker, Paul R, Balocco, Claudio, Song, Aimin, Hall, Steve
Published in Journal of physics. D, Applied physics (14.02.2018)
Published in Journal of physics. D, Applied physics (14.02.2018)
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Journal Article
Effect of HCl cleaning on InSb-Al2O3 MOS capacitors
Vavasour, Oliver J, Jefferies, Richard, Walker, Marc, Roberts, Joseph W, Meakin, Naomi R, Gammon, Peter M, Chalker, Paul R, Ashley, Tim
Published in Semiconductor science and technology (01.03.2019)
Published in Semiconductor science and technology (01.03.2019)
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Journal Article
Linear Ion Trap Fabricated Using Rapid Manufacturing Technology
Clare, Adam T., Gao, Liang, Brkić, Boris, Chalker, Paul R., Taylor, Stephen
Published in Journal of the American Society for Mass Spectrometry (01.02.2010)
Published in Journal of the American Society for Mass Spectrometry (01.02.2010)
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Journal Article
Characterization of Negative-Bias Temperature Instability of Ge MOSFETs With / Stack
Jigang Ma, Jian Fu Zhang, Zhigang Ji, Benbakhti, Brahim, Wei Dong Zhang, Xue Feng Zheng, Mitard, Jerome, Kaczer, Ben, Groeseneken, Guido, Hall, Steve, Robertson, John, Chalker, Paul R.
Published in IEEE transactions on electron devices (01.05.2014)
Published in IEEE transactions on electron devices (01.05.2014)
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Journal Article
Influence of Polymorphism on the Electronic Structure of Ga2O3
Swallow, Jack N., Vorwerk, Christian, Mazzolini, Piero, Vogt, Patrick, Bierwagen, Oliver, Karg, Alexander, Eickhoff, Martin, Schörmann, Jörg, Wagner, Markus R., Roberts, Joseph W., Chalker, Paul R., Smiles, Matthew J., Murgatroyd, Philip, Razek, Sara A., Lebens-Higgins, Zachary W., Piper, Louis J., Jones, Leanne A. H., Thakur, Pardeep K., Lee, Tien-Lin, Varley, Joel B., Furthmüller, Jürgen, Draxl, Claudia, Veal, Tim D., Regoutz, Anna
Published in Chemistry of materials (02.09.2020)
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Published in Chemistry of materials (02.09.2020)
Journal Article
Band Line-up Investigation of Atomic Layer Deposited TiAlO and GaAlO on GaN
Das, Partha, Jones, Leanne A. H., Gibbon, James T., Dhanak, Vinod R., Partida-Manzanera, Teresa, Roberts, Joseph W., Potter, Richard, Chalker, Paul R., Cho, Sung-Jin, Thayne, Iain G., Mahapatra, Rajat, Mitrovic, Ivona Z.
Published in ECS journal of solid state science and technology (22.07.2020)
Published in ECS journal of solid state science and technology (22.07.2020)
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Erratum to: “Atomic vapour deposition (AVD) of SrBi2Ta2O9 using an all alkoxide precursor system” [J. Crystal Growth 272 (2004) 778]
Chalker, Paul R., Potter, Richard J., Roberts, John L., Jones, Anthony C., Smith, Lesley M., Schumacher, Marcus
Published in Journal of crystal growth (01.03.2005)
Published in Journal of crystal growth (01.03.2005)
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