Unique size and shape-dependent uptake behaviors of non-spherical nanoparticles by endothelial cells due to a shearing flow
Jurney, Patrick, Agarwal, Rachit, Singh, Vikramjit, Choi, David, Roy, Krishnendu, Sreenivasan, S.V., Shi, Li
Published in Journal of controlled release (10.01.2017)
Published in Journal of controlled release (10.01.2017)
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Journal Article
Enhanced Photoresponse in Metasurface-Integrated Organic Photodetectors
Xu, Xin, Kwon, Hoyeong, Gawlik, Brian, Mohammadi Estakhri, Nasim, Alù, Andrea, Sreenivasan, S.V, Dodabalapur, Ananth
Published in Nano Letters (13.06.2018)
Published in Nano Letters (13.06.2018)
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Journal Article
Progress in mask replication using jet and flash imprint lithography
Selinidis, Kosta S, Brooks, Cynthia B, Doyle, Gary F, Brown, Laura, Jones, Chris, Imhof, Joseph, LaBrake, Dwayne L, Resnick, Douglas J, Sreenivasan, S.V
Published in Alternative Lithographic Technologies III (01.01.2011)
Published in Alternative Lithographic Technologies III (01.01.2011)
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Journal Article
Conference Proceeding
Active wafer shape modulation using a multi-actuator chucking system
Cherala, Anshuman, Choi, Byung Jin, Lu, Xiaoming, Sreenivasan, S.V.
Published in Precision Engineering (01.10.2014)
Published in Precision Engineering (01.10.2014)
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Journal Article
Scalable Fabrication of Low Elastic Modulus Polymeric Nanocarriers With Controlled Shapes for Diagnostics and Drug Delivery
Singh, Vikramjit, Agarwal, Rachit, Jurney, Patrick, Marshall, Kervin, Roy, Krishnendu, Shi, Li, Sreenivasan, S.V
Published in Journal of micro and nano-manufacturing (01.03.2015)
Published in Journal of micro and nano-manufacturing (01.03.2015)
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Journal Article
Template fabrication schemes for step and flash imprint lithography
Bailey, T.C., Resnick, D.J., Mancini, D., Nordquist, K.J., Dauksher, W.J., Ainley, E., Talin, A., Gehoski, K., Baker, J.H., Choi, B.J., Johnson, S., Colburn, M., Meissl, M., Sreenivasan, S.V., Ekerdt, J.G., Willson, C.G.
Published in Microelectronic Engineering (01.07.2002)
Published in Microelectronic Engineering (01.07.2002)
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Journal Article
Conference Proceeding
Ramifications of lubrication theory on imprint lithography
Colburn, Matthew, Choi, Byung Jin, Sreenivasan, S.V., Bonnecaze, Roger T., Grant Willson, C.
Published in Microelectronic Engineering (01.09.2004)
Published in Microelectronic Engineering (01.09.2004)
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Journal Article
High-resolution defect inspection of step-and-flash imprint lithography for 32-nm half-pitch patterning
Selinidis, Kosta, Thompson, Ecron, McMackin, Ian, Sreenivasan, S.V, Resnick, Douglas J
Published in Alternative Lithographic Technologies (01.02.2009)
Published in Alternative Lithographic Technologies (01.02.2009)
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Journal Article
Conference Proceeding
Process control for 32 nm imprint masks using variable shape beam pattern generators
Thompson, Ecron, Selinidis, Kosta, Maltabes, John G., Resnick, Douglas J., Sreenivasan, S.V.
Published in Microelectronic Engineering (01.04.2009)
Published in Microelectronic Engineering (01.04.2009)
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Journal Article
Conference Proceeding
Distortion and overlay performance of UV step and repeat imprint lithography
Choi, Jin, Nordquist, Kevin, Cherala, Ashuman, Casoose, Lester, Gehoski, Kathy, Dauksher, William J., Sreenivasan, S.V., Resnick, Douglas J.
Published in Microelectronic Engineering (01.03.2005)
Published in Microelectronic Engineering (01.03.2005)
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Journal Article
Conference Proceeding
Fabrication of multi-tiered structures on step and flash imprint lithography templates
Johnson, S., Resnick, D.J., Mancini, D., Nordquist, K., Dauksher, W.J., Gehoski, K., Baker, J.H., Dues, L., Hooper, A., Bailey, T.C., Sreenivasan, S.V., Ekerdt, J.G., Willson, C.G.
Published in Microelectronic Engineering (01.06.2003)
Published in Microelectronic Engineering (01.06.2003)
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Journal Article
Conference Proceeding
Organization of big metrology data within the Cyber-Physical Manufacturing Metrology Model (CPM3)
Sabbagh, Ramin, Živković, Srdjan, Gawlik, Brian, Sreenivasan, S.V., Stothert, Alec, Majstorovic, Vidosav, Djurdjanovic, Dragan
Published in CIRP journal of manufacturing science and technology (01.01.2022)
Published in CIRP journal of manufacturing science and technology (01.01.2022)
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