by Postek, Michael T, Vladár, András, Dagata, John, Farkas, Natalia, Ming, Bin, Wagner, Ryan, Raman, Arvind, Moon, Robert J, Sabo, Ronald, Wegner, Theodore H, Beecher, James
Published in Measurement Science and Technology (01.02.2011)

by Toth, Milos, Lobo, Charlene J, Knowles, W. Ralph, Phillips, Matthew R, Postek, Michael T, Vladár, András E
Published in Nano Letters (01.02.2007)

by Postek, Michael T., Vladár, Andras E.
Published in Scanning (01.11.2008)

by Postek, Michael T, Vladár, András E
Published in Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (01.01.2015)

by Postek, Michael T, Poster, Dianne L
Published in Proceedings of SPIE, the international society for optical engineering (01.01.2017)

by Stefaniak, Aleksandr B., Hackley, Vincent A., Roebben, Gert, Ehara, Kensei, Hankin, Steve, Postek, Michael T., Lynch, Iseult, Fu, Wei-En, Linsinger, Thomas P.J., Thünemann, Andreas F.
Published in Nanotoxicology (01.12.2013)

by Vladar, Andras E, Postek, Jr, Michael T, Vane, Ronald
Published in Proceedings of SPIE (22.08.2001)

by Kombolias, Mary, Obrzut, Jan, Postek, Michael T., Poster, Dianne L., Obeng, Yaw S.
Published in Analytical letters (11.02.2020)

by Poster, Dianne L, Miller, C. Cameron, Obeng, Yaw, Postek, Michael T, Cowan, Troy E, Martinello, Richard A
Published in Proceedings of SPIE, the international society for optical engineering (01.01.2018)

by Postek, Michael T, Vladár, András, Archie, Charles, Ming, Bin
Published in Measurement science & technology (01.02.2011)

by Obeng, Yaw S, Nablo, Brian J, Reyes, Darwin R, Poster, Dianne L, Postek, Michael T
Published in Journal of research of the National Institute of Standards and Technology (2021)

by Swain, Sujay, Swain, Sudhish, Poster, Dianne L, Postek, Michael T
Year of Publication 05.03.2021

by Poster, Dianne L, Miller, C Cameron, Martinello, Richard A, Horn, Norman R, Postek, Michael T, Cowan, Troy E, Obeng, Yaw S, Kasianowicz, John J
Published in Journal of research of the National Institute of Standards and Technology (2021)

by Postek, Michael T, Vladár, András E
Published in Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (01.01.2015)

by Postek, Michael T., Poster, Dianne L., Vládar, András E., Driscoll, Mark S., LaVerne, Jay A., Tsinas, Zois, Al-Sheikhly, Mohamad I.
Published in Radiation physics and chemistry (01.02.2018)

by Kombolias, Mary, Obrzut, Jan, Postek, Michael T., Poster, Dianne L., Obeng, Yaw S.
Published in Journal of Visualized Experiments (04.10.2019)

by Poster, Dianne L, Postek, Michael T, Obeng, Yaw S, Kasianowicz, John J, Cowan, Troy E, Horn, Norman R, Miller, C Cameron, Martinello, Richard A
Published in Journal of research of the National Institute of Standards and Technology (2021)

by Tanaka, Mitsuru, Baba, Tetsuya, Postek, Michael T
Published in Measurement science & technology (01.02.2011)

by Postek, Michael T., Vladár, András E., Villarrubia, John S., Muto, Atsushi
Published in Microscopy and microanalysis (01.08.2016)

by Postek, Michael T., Villarrubia, John, Vladár, András E., Muto, Atsushi
Published in Microscopy and microanalysis (01.07.2016)