Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Lu, Wei-Siang, Jian, Fu-Yen, Tsai, Chih-Tsung, Huang, Sheng-Yao, Lin, Chia-Sheng
Published in Applied Physics Letters (11.07.2011)
Published in Applied Physics Letters (11.07.2011)
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Journal Article
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress
Chen, Te-Chih, Chang, Ting-Chang, Tsai, Chih-Tsung, Hsieh, Tien-Yu, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun
Published in Applied Physics Letters (13.09.2010)
Published in Applied Physics Letters (13.09.2010)
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Journal Article
Engaging university students in a library guide through wearable spherical video-based virtual reality: effects on situational interest and cognitive load
Lin, Hota Chia-Sheng, Yu, Shih-Jou, Sun, Jerry Chih-Yuan, Jong, Morris Siu Yung
Published in Interactive learning environments (17.11.2021)
Published in Interactive learning environments (17.11.2021)
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Journal Article
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
LIN, Chia-Sheng, CHEN, Ying-Chung, SHIH, Jou-Miao, CHANG, Ting-Chang, JIAN, Fu-Yen, HSU, Wei-Che, KUO, Yuan-Jui, DAI, Chih-Hao, CHEN, Te-Chih, LO, Wen-Hung, HSIEH, Tien-Yu
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
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Journal Article
Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress
Chung, Wan-Fang, Chang, Ting-Chang, Lin, Chia-Sheng, Tu, Kuan-Jen, Li, Hung-Wei, Tseng, Tseung-Yuen, Chen, Ying-Chung, Tai, Ya-Hsiang
Published in Journal of The Electrochemical Society (01.01.2012)
Published in Journal of The Electrochemical Society (01.01.2012)
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Journal Article
Effect of N2O plasma treatment on the improvement of instability under light illumination for InGaZnO thin-film transistors
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, LU, Wei-Hsiang, CHEN, Shih-Cheng, JIAN, Fu-Yen, LIN, Chia-Sheng
Published in Thin Solid Films (30.12.2011)
Published in Thin Solid Films (30.12.2011)
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Journal Article
Conference Proceeding
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
HSIEH, Tien-Yu, CHANG, Ting-Chang, CHEN, Te-Chih, TSAI, Ming-Yen, CHEN, Yu-Te, JIAN, Fu-Yen, LIN, Chia-Sheng, TSAI, Wu-Wei, CHIANG, Wen-Jen, YAN, Jing-Yi
Published in Surface & coatings technology (01.09.2013)
Published in Surface & coatings technology (01.09.2013)
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Journal Article
Conference Proceeding
A New Technique to Increase Reliability in Measuring the Axis of Bone
Lin, Chia-Sheng, MD, Wu, Tai-Yin, MD, PhD, Wang, Ting-Ming, MD, PhD, Hou, Sheng-Mou, MD, MPH, PhD, Shih, Kao-Shang, MD, PhD, Liaw, Chen-Kun, MD, PhD
Published in The Journal of foot and ankle surgery (01.01.2016)
Published in The Journal of foot and ankle surgery (01.01.2016)
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Journal Article
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
Lin, Chia-Sheng, Chen, Ying-Chung, Chang, Ting-Chang, Jian, Fu-Yen, Li, Hung-Wei, Chen, Yi-Chuan, Chen, Te-Chih, Tai, Ya-Hsiang
Published in Applied Physics Letters (21.03.2011)
Published in Applied Physics Letters (21.03.2011)
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Journal Article
Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film Transistors
LI, Hung-Wei, CHANG, Ting-Chang, CHANG, Geng-Wei, LIN, Chia-Sheng, TSAI, Tsung-Ming, JIAN, Fu-Yen, TAI, Ya-Hsiang, LEE, Ming-Hsien
Published in IEEE electron device letters (01.10.2011)
Published in IEEE electron device letters (01.10.2011)
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Journal Article
Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs
LIN, Chia-Sheng, CHEN, Ying-Chung, CHANG, Ting-Chang, CHEN, Shih-Ching, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Te-Chih, WENG, Chi-Feng, JIN LU, HSU, Wei-Che
Published in IEEE electron device letters (01.11.2009)
Published in IEEE electron device letters (01.11.2009)
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Journal Article
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
CHEN, Te-Chih, CHANG, Ting-Chang, CHEN, Shih-Ching, HSIEH, Tien-Yu, JIAN, Fu-Yen, LIN, Chia-Sheng, LI, Hung-Wei, LEE, Ming-Hsien, CHEN, Jim-Shone, SHIH, Ching-Chieh
Published in IEEE Electron Device Letters (01.12.2010)
Published in IEEE Electron Device Letters (01.12.2010)
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Journal Article
Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device
CHEN, Te-Chih, CHANG, Ting-Chang, JIAN, Fu-Yen, CHEN, Shih-Ching, LIN, Chia-Sheng, LEE, Ming-Hsien, CHEN, Jim-Shone, SHIH, Ching-Chieh
Published in IEEE electron device letters (01.08.2009)
Published in IEEE electron device letters (01.08.2009)
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Journal Article
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
LIN, Chia-Sheng, CHEN, Ying-Chung, CHEN, Jim-Shone, CHANG, Ting-Chang, JIAN, Fu-Yen, LI, Hung-Wei, CHEN, Shih-Ching, CHUANG, Ying-Shao, CHEN, Te-Chih, TAI, Ya-Hsiang, LEE, Ming-Hsien
Published in IEEE electron device letters (01.03.2011)
Published in IEEE electron device letters (01.03.2011)
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Journal Article
Light-induced instability of an InGaZnO thin film transistor with and without SiOx passivation layer formed by plasma-enhanced-chemical-vapor-deposition
Chen, Te-Chih, Chang, Ting-Chang, Hsieh, Tien-Yu, Tsai, Chih-Tsung, Chen, Shih-Ching, Lin, Chia-Sheng, Hung, Ming-Chin, Tu, Chun-Hao, Chang, Jiun-Jye, Chen, Po-Lun
Published in Applied physics letters (08.11.2010)
Published in Applied physics letters (08.11.2010)
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