Characterization of Fiber/Matrix Interfaces Using X-Ray Microtopography
Cevdet Noyan, I., Kaldor, Steffen K., Hanan, Jay.C., Swift, Geoffrey A., Aydiner, Cahit Can, Üstündag, Ersan
Published in Materials science forum (07.08.2002)
Published in Materials science forum (07.08.2002)
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Journal Article
Conference Proceeding
Chip cracks during assembly: Finding and eliminating the critical defect
Sauter, W., Kaldor, S., Clark, J., Laforte, S., McCarthy, C., Restaino, D., Casey, J., Questad, D.
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01.05.2011)
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Conference Proceeding