Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Kuo, Shu-Cheng, Guo, Ethan, Zhang, Ya-Min, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Li, Te-Liang, Huang, Ray, Chen, Kuo-Ji, Song, Ming-Hsiang, Lu, Ryan, Xia, Kejun
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Protection Schemes for Plasma Induced Damage from Well-Side Antennas
Kuo, Hsi-Yu, Chu, Yu-Lin, Dai, Hung-Da, Wang, Chun-Chi, Lin, Pei-Jung, Guo, Ethan, Su, Yu-Ti, Hsu, Chia-Lin, Chen, Kuan-Hung, Chen, Tsung-Yuan, Lu, Ryan, Liang, Victor, Chen, Kuo-Ji, Xia, Kejun
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
FinFET SCR structure optimization for high-speed serial links ESD protection
Li-Wei Chu, Yi-Feng Chang, Yu-Ti Su, Kuo-Ji Chen, Ming-Hsiang Song, Jam-Wem Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
High thermal conductive Graphene-based Composites and its Controllable ESD Application on Device Packaging
Lin, Rong-Teng, Wu, Bi-Xian, Yang, Yun-Hong, Hsu, Teng-Chin, Chao, Chia-Lien, Chang, Yu-Chiao, Su, Chiao-Jung, Lee, Jam-Wem, Chen, Kuo-Ji, Lin, Wun-Jie, Liu, Chien-Hao, Chang, Tzu-Hsuan
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)
Published in 2023 45th Annual EOS/ESD Symposium (EOS/ESD) (02.10.2023)
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Conference Proceeding
Improved Field-Emission Properties of Carbon Nanotube Field-Emission Arrays by Controlled Density Growth of Carbon Nanotubes
Juan, Chuan-Ping, Chen, Kuo-Ji, Tsai, Chun-Chien, Lin, Kao-Chao, Hong, Wei-Kai, Hsieh, Chen-Yu, Wang, Wen-Pin, Lai, Rui-Ling, Chen, Kuei-Hsien, Chen, Li-Chyong, Cheng, Huang-Chung
Published in Japanese Journal of Applied Physics (2005)
Published in Japanese Journal of Applied Physics (2005)
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Journal Article
An on-chip combo clamp for surge and universal ESD protection in bulk FinFET technology
Ming-Fu Tsai, Jen-Chou Tseng, Chung-Yu Huang, Tzu-Heng Chang, Kuo-Ji Chen, Ming-Hsiang Song
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)
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Conference Proceeding
Investigation and solution to the early failure of parasitic NPN triggered by the adjacent PNP ESD clamps
Ming-Fu Tsai, Jen-Chou Tseng, Kuo-Ji Chen, Ming-Hsiang Song
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding
Fabrication and Characterization of Carbon Nanotube Triodes
Hong, Wei-Kai, Chen, Kuei-Hsien, Chen, Li-Chyong, Tarntair, Fu-Gow, Chen, Kuo-Ji, Lin, Jia-Bin, Cheng, Huang-Chung
Published in Japanese Journal of Applied Physics (01.05.2001)
Published in Japanese Journal of Applied Physics (01.05.2001)
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Journal Article
A high-reliable self-isolation current-mode transmitter (CM-Tx) design for +/−60V automotive interface with Bulk-BCD technology
Wen-Yang Hsu, Po-Hsiang Lan, Wan-Yen Lin, Jam-Wem Lee, Kuo-Ji Chen, Ming-Hsiang Song
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
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Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
Conference Proceeding
Enabling circuit design using FinFETs through close ecosystem collaboration
Sheu, Bing J., Chih-Sheng Chang, Yen-Huei Chen, Ken Wang, Kuo-Ji Chen, Yung-Chow Peng, Li-Chun Tien, Ming-Hsiang Song, Hou, Cliff, Sun, Jack Yuan-Chen, Chenming Hu
Published in 2013 Symposium on VLSI Technology (01.06.2013)
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Published in 2013 Symposium on VLSI Technology (01.06.2013)
Conference Proceeding
Gate-driven 3.3V ESD clamp using 1.8V transistors
Guang-Cheng Wang, Chia-Hui Chen, Wen-Hsin Huang, Kuo-Ji Chen, Ming-Hsiang Song, Ta-Pen Guo
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
Published in 2011 IEEE International Conference on IC Design & Technology (01.05.2011)
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Conference Proceeding
TAP CELLS
RUSU STEFAN, LAI PO CHIA, SCOTT DAVID BARRY, ISLAM RABIUL, LIN WUN JIE, SU YU TI, CHEN WEN HAO, YING SHU YI, CHEN KUO JI, LI KUAN TE
Year of Publication 28.01.2020
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Year of Publication 28.01.2020
Patent
Low-Capacitance SCR for On-Chip ESD Protection with High CDM Tolerance in 7nm Bulk FinFET Technology
Peng, Po-Lin, Chu, Li-Wei, Tsai, Ming-Fu, Su, Yu-Ti, Lee, Jam-Wem, Chen, Kuo-Ji, Song, Ming-Hsiang
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
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