Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
Bansal, Aditya, Rao, Rahul, Kim, Jae-Joon, Zafar, Sufi, Stathis, James H., Chuang, Ching-Te
Published in Microelectronics Reliability (01.06.2009)
Published in Microelectronics Reliability (01.06.2009)
Get full text
Journal Article
The physics of NBTI: What do we really know?
Stathis, James H.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Get full text
Conference Proceeding
Journal Article
Dielectric breakdown mechanisms in gate oxides
Lombardo, Salvatore, Stathis, James H., Linder, Barry P., Pey, Kin Leong, Palumbo, Felix, Tung, Chih Hang
Published in Journal of Applied Physics (15.12.2005)
Published in Journal of Applied Physics (15.12.2005)
Get more information
Journal Article
Hybrid-orientation technology (HOT): opportunities and challenges
Min Yang, Chan, V.W.C., Chan, K.K., Shi, L., Fried, D.M., Stathis, J.H., Chou, A.I., Gusev, E., Ott, J.A., Burns, L.E., Fischetti, M.V., Meikei Ieong
Published in IEEE Transactions on Electron Devices (01.05.2006)
Published in IEEE Transactions on Electron Devices (01.05.2006)
Get full text
Journal Article
Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities
Wu, Ernest Y., Baozhen Li, Stathis, James H., LaRow, Charles
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Get full text
Conference Proceeding
Journal Article
Control and Modification of Nematic Liquid Crystal Pretilt Angles on Polyimides
LEE, K.-W, LIEN, A, STATHIS, J. H, PAEK, S.-H
Published in Japanese Journal of Applied Physics (01.06.1997)
Published in Japanese Journal of Applied Physics (01.06.1997)
Get full text
Journal Article
Recovery study of negative bias temperature instability
Wang, Miaomiao, Zafar, Sufi, Stathis, James H.
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
Get full text
Journal Article
Conference Proceeding
Ultra-thin oxide reliability for ULSI applications
Wu, Ernest Y, Stathis, James H, Han, Liang-Kai
Published in Semiconductor science and technology (01.05.2000)
Published in Semiconductor science and technology (01.05.2000)
Get full text
Journal Article
Controversial issues in negative bias temperature instability
Stathis, James H., Mahapatra, Souvik, Grasser, Tibor
Published in Microelectronics and reliability (01.02.2018)
Published in Microelectronics and reliability (01.02.2018)
Get full text
Journal Article
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
Bansal, A., Rao, R., Jae-Joon Kim, Zafar, S., Stathis, J.H., Ching-Te Chuang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
Journal Article
Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC-AC Experimental Conditions
Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik
Published in IEEE transactions on electron devices (01.01.2018)
Published in IEEE transactions on electron devices (01.01.2018)
Get full text
Journal Article
HOT-carrier degradation in undoped-body ETSOI FETS and SOI FINFETS
Miaomiao Wang, Kulkarni, Pranita, Kangguo Cheng, Khakifirooz, Ali, Basker, V S, Jagannathan, Hemanth, Chun-Chen Yeh, Paruchuri, Vamsi, Doris, Bruce, Huiming Bu, Chung-Hsun Lin, Stathis, James H, Maitra, Kingsuk, Oldiges, Philip J
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Get full text
Conference Proceeding
Applications of clustering model to bimodal distributions for dielectric breakdown
Wu, Ernest Y., Bolam, Ronald, Filippi, Ronald, Stathis, James H., Li, Baozhen, Kim, Andrew
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.01.2017)
Published in Journal of vacuum science and technology. B, Nanotechnology & microelectronics (01.01.2017)
Get more information
Journal Article