Probing Covalent Interactions at a Silicone Adhesive/Nylon Interface
Lin, Ting, Wu, Yuchen, Santos, Elizabeth, Chen, Xiaoyun, Kelleher-Ferguson, Jack, Tucker, Chris, Ahn, Dongchan, Mohler, Carol, Chen, Zhan
Published in Langmuir (01.03.2022)
Published in Langmuir (01.03.2022)
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Journal Article
Flying probe test systems: capabilities for effective testing
Ferguson, J.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)
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Conference Proceeding
Logic design verification via test generation
Abadir, M.S., Ferguson, J., Kirkland, T.E.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1988)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1988)
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Journal Article
Finding I/O faults on in-circuit ICs using parasitic transistor tests
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Conference Proceeding