by Tsujikawa, S., Yugami, J.
Published in IEEE transactions on electron devices (01.01.2006)

by Maeda, Tatsuro, Mieda, Eiko, Ishii, Hiroyuki, Itatani, Taro, Hattori, H, Yasuda, Tetsuji, Maeda, Atsuhiko, Kurashima, Yuichi, Takagi, Hideki, Aoki, T, Yamamoto, T, Ichikawa, Osamu, Osada, T, Takada, T, Hata, Masahiko, Yugami, J, Ogawa, A, Kikuchi, T, Kunii, Y
Published in ECS transactions (12.08.2014)

by Kawahara, T., Nishida, Y., Sakashita, S., Mizutani, M., Inoue, M., Yamanari, S., Higashi, M., Hayashi, T., Murata, N., Honda, K., Yugami, J., Yoshimura, H., Yoneda, M.
Published in IEEE electron device letters (01.10.2007)

by Tsujikawa, S., Mine, T., Watanabe, K., Shimamoto, Y., Tsuchiya, R., Ohnishi, K., Onai, T., Yugami, J., Kimura, S.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)

by Morooka, T, Sato, M, Matsuki, T, Suzuki, T, Shiraishi, K, Uedono, A, Miyazaki, S, Ohmori, K, Yamada, K, Nabatame, T, Chikyow, T, Yugami, J, Ikeda, K, Ohji, Y
Published in 2010 Symposium on VLSI Technology (01.06.2010)

by Tonomura, O., Shimamoto, Y., Miki, H., Saito, S.-I., Torii, K., Hiratani, M., Yugami, J.
Published in IEEE transactions on electron devices (01.10.2004)

by Kawahara, T., Kobayashi, T., Jyouno, Y., Saeki, S.-i., Miyamoto, N., Adachi, T., Kato, M., Sato, A., Yugami, J., Kume, H., Kimura, K.
Published in IEEE journal of solid-state circuits (01.11.1996)

by Tsujikawa, S., Akamatsu, Y., Umeda, H., Yugami, J.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Shimamoto, Y., Yugami, J., Inoue, M., Mizutani, M., Hayashi, T., Shiga, K., Fujita, F., Yoneda, M., Matsuoka, H.
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)

by Inoue, M., Yugami, J., Fujita, T., Shiga, K., Mizutani, M., Nomura, K., Tsuchimoto, J., Ohno, Y., Yoneda, M.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Yamada, R.-I., Yugami, J.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Tsujikawa, Shimpei, Yugami, Jiro
Published in Microelectronics and reliability (2005)

by Hozawa, K., Miyazaki, H., Yugami, J.
Published in Digest. International Electron Devices Meeting (2002)

by Yamada, R., Sekiguchi, T., Okuyama, Y., Yugami, J., Kume, H.
Published in 2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184) (2001)

by Tonomura, O., Shimamoto, Y., Torii, K., Hiratani, M., Saito, S., Yugami, J.
Published in International Conference on Microelectronic Test Structures, 2003 (2003)

by Yugami, J., Ohkura, M.
Published in Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures (1994)

by Tsujikawa, S., Mine, T., Shimamoto, Y., Tonomura, O., Tsuchiya, R., Ohnishi, K., Hamamura, H., Torii, K., Onai, T., Yugami, J.
Published in 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) (2002)

by Tsuchiya, R., Ohnishi, K., Horiuchi, M., Tsujikawa, S., Shimamoto, Y., Inada, N., Yugami, J., Ootsuka, F., Onai, T.
Published in 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) (2002)

by Ishimaru, T., Matsuzaki, N., Okuyama, Y., Mine, T., Watanabe, K., Yugami, J., Kume, H., Ito, F., Kawashima, Y., Sakai, T., Kanamaru, Y., Ishii, Y., Mizuno, M., Kamohara, S., Hashimoto, T., Okuyama, K., Kuroda, K., Kubota, K.
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)

by Yugami, J., Itoga, T., Ohkura, M.
Published in Proceedings of International Electron Devices Meeting (1995)