Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
Bansal, Aditya, Rao, Rahul, Kim, Jae-Joon, Zafar, Sufi, Stathis, James H., Chuang, Ching-Te
Published in Microelectronics and reliability (01.06.2009)
Published in Microelectronics and reliability (01.06.2009)
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Journal Article
The physics of NBTI: What do we really know?
Stathis, James H.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
Hybrid-orientation technology (HOT): opportunities and challenges
Min Yang, Chan, V.W.C., Chan, K.K., Shi, L., Fried, D.M., Stathis, J.H., Chou, A.I., Gusev, E., Ott, J.A., Burns, L.E., Fischetti, M.V., Meikei Ieong
Published in IEEE transactions on electron devices (01.05.2006)
Published in IEEE transactions on electron devices (01.05.2006)
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Journal Article
Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities
Wu, Ernest Y., Baozhen Li, Stathis, James H., LaRow, Charles
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Control and modification of nematic liquid crystal pretilt angles on polyimides
LEE, K.-W, LIEN, A, STATHIS, J. H, PAEK, S.-H
Published in Japanese Journal of Applied Physics (01.06.1997)
Published in Japanese Journal of Applied Physics (01.06.1997)
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Journal Article
Recovery study of negative bias temperature instability
Wang, Miaomiao, Zafar, Sufi, Stathis, James H.
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
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Journal Article
Conference Proceeding
Ultra-thin oxide reliability for ULSI applications
Wu, Ernest Y, Stathis, James H, Han, Liang-Kai
Published in Semiconductor science and technology (01.05.2000)
Published in Semiconductor science and technology (01.05.2000)
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Journal Article
Controversial issues in negative bias temperature instability
Stathis, James H., Mahapatra, Souvik, Grasser, Tibor
Published in Microelectronics and reliability (01.02.2018)
Published in Microelectronics and reliability (01.02.2018)
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Journal Article
Impact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
Bansal, A., Rao, R., Jae-Joon Kim, Zafar, S., Stathis, J.H., Ching-Te Chuang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC-AC Experimental Conditions
Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik
Published in IEEE transactions on electron devices (01.01.2018)
Published in IEEE transactions on electron devices (01.01.2018)
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Journal Article
HOT-carrier degradation in undoped-body ETSOI FETS and SOI FINFETS
Miaomiao Wang, Kulkarni, Pranita, Kangguo Cheng, Khakifirooz, Ali, Basker, V S, Jagannathan, Hemanth, Chun-Chen Yeh, Paruchuri, Vamsi, Doris, Bruce, Huiming Bu, Chung-Hsun Lin, Stathis, James H, Maitra, Kingsuk, Oldiges, Philip J
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs
Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications
Wu, Ernest Y., Kim, Andrew, Li, Baozhen, Stathis, James H.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
Comparison of DC and AC NBTI kinetics in RMG Si and SiGe p-FinFETs
Parihar, Narendra, Southwick, Richard G., Sharma, Uma, Miaomiao Wang, Stathis, James H., Mahapatra, Souvik
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor
Wang, Miaomiao, Zhang, Jingyun, Zhou, Huimei, Southwick, Richard G., Kuo Chao, Robin Hsin, Miao, Xin, Basker, Veeraraghavan S., Yamashita, Tenko, Guo, Dechao, Karve, Gauri, Bu, Huiming, Stathis, James H.
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding