A new object based quality metric based on SIFT and SSIM
Decombas, M., Dufaux, F., Renan, E., Pesquet-Popescu, B., Capman, F.
Published in 2012 19th IEEE International Conference on Image Processing (01.09.2012)
Published in 2012 19th IEEE International Conference on Image Processing (01.09.2012)
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One Class Support Vector Machines for audio abnormal events detection
Lecomte, S., Lengelle, R., Richard, C., Capman, F.
Published in 2011 IEEE Statistical Signal Processing Workshop (SSP) (01.06.2011)
Published in 2011 IEEE Statistical Signal Processing Workshop (SSP) (01.06.2011)
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Mapping Embedded Applications on MPSoCs: The MNEMEE Approach
Baloukas, C, Papadopoulos, L, Soudris, D, Stuijk, S, Jovanovic, O, Schmoll, F, Cordes, D, Pyka, R, Mallik, A, Mamagkakis, S, Capman, F, Collet, S, Mitas, N, Kritharidis, D
Published in 2010 IEEE Computer Society Annual Symposium on VLSI (01.07.2010)
Published in 2010 IEEE Computer Society Annual Symposium on VLSI (01.07.2010)
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