Impact of DC and RF non-conducting stress on nMOS reliability
Cattaneo, A., Pinarello, S., Mueller, J.-E, Weigel, R.
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
MOSFET degradation under DC and RF Fowler-Nordheim stress
Cattaneo, A., Pinarello, S., Mueller, J.-E, Weigel, R.
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
Published in 2014 44th European Solid State Device Research Conference (ESSDERC) (01.09.2014)
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Conference Proceeding
Frequency response of stress-effects on CMOS power amplifiers
Cattaneo, A., Pinarello, S., Mueller, J-E, Weigel, R.
Published in 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) (01.10.2014)
Published in 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) (01.10.2014)
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Conference Proceeding
Highly linear robust RF switch with low insertion loss and high power handling capability in a 65nm CMOS technology
Rascher, J., Pinarello, S., Mueller, J-E, Fischer, G., Weigel, R.
Published in 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2012)
Published in 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2012)
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Conference Proceeding
Geometrical demonstration of the VSWR-locus in different reference planes and its applications
Pinarello, S., Mueller, J.-E., Weigel, R.
Published in 2009 Asia Pacific Microwave Conference (01.12.2009)
Published in 2009 Asia Pacific Microwave Conference (01.12.2009)
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Conference Proceeding
Methods for low insertion loss RF Switches with increased power handling capability in 65nm CMOS
Rascher, J., Pinarello, S., Mueller, Jan-Erik, Fischer, G., Weigel, R.
Published in Asia-Pacific Microwave Conference 2011 (01.12.2011)
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Published in Asia-Pacific Microwave Conference 2011 (01.12.2011)
Conference Proceeding