by Wahl, J.A., VanDelden, J.S., Tiwari, S.
Published in IEEE photonics technology letters (01.08.2004)

by Hopstaken, M. J. P., Pfeiffer, D., Copel, M., Gordon, M. S., Ando, T., Narayanan, V., Jagannathan, H., Molis, S., Wahl, J. A., Bu, H., Sadana, D. K., Czornomaz, L., Marchiori, C., Fompeyrine, J.
Published in Surface and interface analysis (01.01.2013)

by Tiwari, S, Wahl, J A, Silva, H, Rana, F, Welser, J J
Published in Applied physics. A, Materials science & processing (01.10.2000)

by Wahl, A.J.
Published in IEEE transactions on electron devices (01.01.1974)

by DeJong, J T, Jaeger, R A, Boulanger, R W, Randolph, M F, Wahl, D A J
Published in Geotechnical and Geophysical Site Characterization : Proceedings of the 4th International Conference on Site Characterization ISC-4 (01.01.2013)

by Carter, Rick J, Sporer, Ryan, McArdle, Timothy J, Mulfinger, George Robert, Holt, Judson Robert, Beasor, Scott, Child, Amy, Fronheiser, Jody, Wahl, Jeremy A, Geisler, Holm, Kluth, George J, Triyoso, Dina H, Punchihewa, Kasun, Rana, Uzma, Vanamurthy, Laks, Sohn, D K
Published in ECS transactions (09.04.2018)

by Wahl, Jeremy A, Van Delden, Jay S, Tiwari, Sandip
Published in Applied optics (2004) (01.09.2005)