New Cell Structure with Edge-thick Tunnel Oxide for Highly Reliable NAND Flash Memory Devices
Tae-Kyung Kim, Jaihyuk Song, Changsub Lee, Dongyean Oh, Taeseok Jang, Jongkwang Lim, Dongjun Lee, Seungjun Lee, Minhwan Lim, Hyunyoung Shim, Bongtae Park, Man-Ki Lee, Hunkook Lee
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
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