Development of the metrology and imaging of cellulose nanocrystals
Postek, Michael T, Vladár, András, Dagata, John, Farkas, Natalia, Ming, Bin, Wagner, Ryan, Raman, Arvind, Moon, Robert J, Sabo, Ronald, Wegner, Theodore H, Beecher, James
Published in Measurement science & technology (01.02.2011)
Published in Measurement science & technology (01.02.2011)
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Journal Article
Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift
Cizmar, Petr, Vladár, András E., Postek, Michael T.
Published in Microscopy and microanalysis (01.04.2011)
Published in Microscopy and microanalysis (01.04.2011)
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Journal Article
Nanotip electron gun for the scanning electron microscope
Vladár, AndráS E., Radi, Zsolt, Postek, Michael T., Joy, David C.
Published in Scanning (01.05.2006)
Published in Scanning (01.05.2006)
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Journal Article
Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research
Postek, Michael T., Vladár, András E., Lowney, Jeremiah R., Keery, William J.
Published in Scanning (01.07.2002)
Published in Scanning (01.07.2002)
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Journal Article
Image sharpness measurement in the scanning electron microscope-Part III
Zhang, Nien Fan, Postek, Michael T., Larrabee, Robert D., Vladár, András E., Keery, William J., Jones, Samuel N.
Published in Scanning (01.07.1999)
Published in Scanning (01.07.1999)
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Journal Article