Beam calibration device
LIAO SHUQING, HE XIAOZHONG, SHI JINSHUI, LONG QUANHONG, WANG YI, BAI HAITAO, LIANG JINHUI
Year of Publication 03.05.2022
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Year of Publication 03.05.2022
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Design method of beam calibration device
LIAO SHUQING, HE XIAOZHONG, SHI JINSHUI, LONG QUANHONG, WANG YI, BAI HAITAO, LIANG JINHUI
Year of Publication 25.03.2022
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Year of Publication 25.03.2022
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Mate charged particle photographic means that line is parallel beam
ZHANG XIAODING, SHI JINSHUI, WEI TAO, YANG GUOJUN, LI YIDING, ZHANG ZHUO, JIANG XIAOGUO
Year of Publication 16.09.2015
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Year of Publication 16.09.2015
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Charged particle photographing device for parallel matching beams
ZHANG XIAODING, SHI JINSHUI, WEI TAO, YANG GUOJUN, LI YIDING, ZHANG ZHUO, JIANG XIAOGUO
Year of Publication 16.09.2015
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Year of Publication 16.09.2015
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Method for testing secondary electron yield of insulating medium material and application
HE JIALONG, CHEN XIN, WANG TAO, SHI JINSHUI, LIU PING, LI JIE, DONG PAN, ZHAO WEI, ZHANG XIAONING, LIU FEIXIANG, YANG JIE
Year of Publication 22.10.2021
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Year of Publication 22.10.2021
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Metal surface secondary electron energy spectrum distribution testing method
HE JIALONG, WANG TAO, PENG YUFEI, ZHENG LE, LI JIE, LIU PING, LONG JIDONG, LAN ZHAOHUI, LIU ERXIANG, SHI JINSHUI, DONG PAN, ZHAO WEI, LI XI, YANG JIE, YANG ZHEN
Year of Publication 04.01.2019
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Year of Publication 04.01.2019
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Double-layer grid mesh spherical secondary electronic collector
HE JIALONG, WANG TAO, PENG YUFEI, ZHENG LE, LI JIE, LIU PING, LONG JIDONG, LAN ZHAOHUI, LIU ERXIANG, SHI JINSHUI, DONG PAN, ZHAO WEI, LI XI, YANG JIE, YANG ZHEN
Year of Publication 28.12.2018
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Year of Publication 28.12.2018
Patent
Method for testing secondary electron transmitting coefficient of metal surface
HE JIALONG, WANG TAO, PENG YUFEI, ZHENG LE, LI JIE, LIU PING, LONG JIDONG, LAN ZHAOHUI, LIU ERXIANG, SHI JINSHUI, DONG PAN, ZHAO WEI, LI XI, YANG JIE, YANG ZHEN
Year of Publication 21.12.2018
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Year of Publication 21.12.2018
Patent
Sample test carrier for secondary electron emission coefficient measurement of dielectric material
HE JIALONG, WANG TAO, PENG YUFEI, ZHENG LE, LI JIE, LIU PING, LONG JIDONG, LAN ZHAOHUI, LIU ERXIANG, SHI JINSHUI, DONG PAN, ZHAO WEI, LI XI, YANG JIE, YANG ZHEN
Year of Publication 27.11.2018
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Year of Publication 27.11.2018
Patent
Pretreatment device of sample for measuring secondary electron emission characteristic of material
HE JIALONG, WANG TAO, PENG YUFEI, ZHENG LE, LI JIE, LIU PING, LONG JIDONG, LAN ZHAOHUI, LIU ERXIANG, SHI JINSHUI, DONG PAN, ZHAO WEI, LI XI, YANG JIE, YANG ZHEN
Year of Publication 27.11.2018
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Year of Publication 27.11.2018
Patent
Charged particle picture-taking device for focusing and imaging based on energy loss
ZHANG XIAODING, SHI JINSHUI, WEI TAO, YANG GUOJUN, LI YIDING, ZHANG ZHUO, JIANG XIAOGUO
Year of Publication 24.09.2014
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Year of Publication 24.09.2014
Patent
Charged particle photographic apparatus based on energy loss and focused imaging
ZHANG XIAODING, SHI JINSHUI, WEI TAO, YANG GUOJUN, LI YIDING, ZHANG ZHUO, JIANG XIAOGUO
Year of Publication 10.09.2014
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Year of Publication 10.09.2014
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Device and method for measuring spatial free attitude of rigid object, and method for analyzing data
WEN LONG, LI HONG, SHI JINSHUI, YANG XINGLIN, ZHANG KAIZHI, LI JIN, JIANG XIAOGUO, WANG YUAN
Year of Publication 05.09.2012
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Year of Publication 05.09.2012
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