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investigating or analysing materials by determining theirchemical or physical properties
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Search Results - "MICHAEL RIESS"
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"MICHAEL RIESS"
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USER GUIDED OBJECT SEGMENTATION RECOGNITION
by
RIESS MICHAEL
,
DUGAN PETER
Year of Publication
01.01.2009
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Identification of brominated flame retardant additives in polymers by infrared spectroscopy
by
RIESS MICHAEL
,
SMIRNOW JULIA
Year of Publication
18.09.2007
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METHOD OF QUANTITATIVELY MEASURING TRACE AMOUNTS OF METALS IN POLYMER SAMPLES
by
RIESS
,
MICHAEL
,
SCHICK, ELENA
Year of Publication
13.09.2007
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METHOD OF QUANTITATIVELY MEASURING TRACE AMOUNTS OF METALS IN POLYMER SAMPLES
by
RIESS MICHAEL
,
SCHICK ELENA
Year of Publication
13.09.2007
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Identification of brominated flame retardant additives in polymers by infrared spectroscopy
by
RIESS MICHAEL
,SMIRNOW JULIA
Year of Publication
27.06.2007
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IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY
by
SMIRNOW, JULIA
,
RIESS
,
MICHAEL
Year of Publication
23.05.2007
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IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY
by
SMIRNOW, JULIA
,
RIESS
,
MICHAEL
Year of Publication
04.01.2007
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IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY
by
SMIRNOW, JULIA
,
RIESS
,
MICHAEL
Year of Publication
23.02.2006
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Identification of brominated flame retardant additives in polymers by infrared spectroscopy
by
RIESS MICHAEL
,
SMIRNOW JULIA
Year of Publication
26.01.2006
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Verfahren zum Messen von sechswertigem Chrom in elektronischen Bauteilen und Baugruppen
by
SMIRNOW, JULIA
,
RIESS
,
MICHAEL
,
SCHUMACHER, HEIKE
Year of Publication
21.08.2008
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METHOD OF MEASURING HEXAVALENT CHROMIUM IN ELECTRONIC COMPONENTS AND ASSEMBLIES
by
SMIRNOW, JULIA
,
RIESS
,
MICHAEL
,
SCHUMACHER, HEIKE
Year of Publication
14.06.2007
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METHOD OF MEASURING HEXAVALENT CHROMIUM IN ELECTRONIC COMPONENTS AND ASSEMBLIES
by
SMIRNOW, JULIA
,
RIESS
,
MICHAEL
,
SCHUMACHER, HEIKE
Year of Publication
26.04.2007
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Method of measuring hexavalent chromium in electronic components and assemblies
by
SCHUMACHER HEIKE
,
RIESS MICHAEL
,
SMIRNOW JULIA
Year of Publication
19.04.2007
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Method for determining chemical content of complex structures using x-ray microanalysis
by
MICHAEL RIESS
,
WILLIAM L OLSON
,
STEVEN M SCHEIFERS
Year of Publication
19.08.2009
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Verfahren zur Bestimmung des chemischen Inhalts komplexer Strukturen unter Verwendung einer Röntgenstrahlenmikroanalyse
by
OLSON, WILLIAM L
,
RIESS
,
MICHAEL
,
SCHEIFERS, STEVEN M
Year of Publication
29.11.2007
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Method for determining chemical content of complex structures using x-ray microanalysis
by
MICHAEL RIESS
,
WILLIAM L OLSON
,
STEVEN M SCHEIFERS
Year of Publication
14.11.2007
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Method for determining chemical content of complex structures using x-ray microanalysis
by
SCHEIFERS STEVEN M.,OLSON WILLIAM L.,
RIESS MICHAEL
Year of Publication
31.10.2007
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Method for determining chemical content of complex structures using X-ray microanalysis
by
OLSON WILLIAM L
,
RIESS MICHAEL
,
SCHEIFERS STEVEN M
Year of Publication
27.03.2007
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METHOD FOR DETERMINING CHEMICAL CONTENT OF COMPLEX STRUCTURES USING X-RAY MICROANALYSIS
by
SCHEIFERS, STEVEN, M
,
OLSON, WILLIAM, L
,
RIESS
,
MICHAEL
Year of Publication
05.10.2006
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Method for determining chemical content of complex structures using X-ray microanalysis
by
OLSON WILLIAM L
,
RIESS MICHAEL
,
SCHEIFERS STEVEN M
Year of Publication
01.06.2006
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