by Wu, Shuilin, Liu, Xiangmei, Hu, Tao, Chu, Paul K, Ho, J. P. Y, Chan, Y. L, Yeung, K. W. K, Chu, C. L, Hung, T. F, Huo, K. F, Chung, C. Y, Lu, W. W, Cheung, K. M. C, Luk, K. D. K
Published in Nano letters (01.11.2008)

by Wu, Shuilin, Chung, C.Y., Liu, Xiangmei, Chu, Paul K., Ho, J.P.Y., Chu, C.L., Chan, Y.L., Yeung, K.W.K., Lu, W.W., Cheung, K.M.C., Luk, K.D.K.
Published in Acta materialia (01.06.2007)

by Ho, J.P.Y., Wu, S.L., Poon, R.W.Y., Chung, C.Y., Tjong, S.C., Chu, P.K., Yeung, K.W.K., Lu, W.W., Cheung, K.M.C., Luk, K.D.K.
Published in Surface & coatings technology (26.02.2007)

by Chan, K.F., Ho, J.P.Y., Li, W.Y., Lau, B.M.F., Tse, A.K.W., Fong, W.F., Bilek, M.M.M., McKenzie, D.R., Chu, P.K., Yu, K.N.
Published in Surface & coatings technology (23.04.2007)

by Ng, C.K.M., Wong, M.Y.P., Lam, R.K.K., Ho, J.P.Y., Yu, K.N.
Published in Radiation measurements (01.12.2011)

by Poon, Ray W.Y., Ho, Joan P.Y., Liu, Xuanyong, Chung, C.Y., Chu, Paul K., Yeung, Kelvin W.K., Lu, William W., Cheung, Kenneth M.C.
Published in Thin solid films (22.09.2005)

by Ho, J.P.Y., Yip, C.W.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.06.2003)

by Yip, C.W.Y., Ho, J.P.Y., Koo, V.S.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.06.2003)

by Ng, F.M.F., Yip, C.W.Y., Ho, J.P.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.02.2004)

by Yip, C.W.Y., Ho, J.P.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.06.2003)

by Ho, J.P.Y., Yip, C.W.Y., Koo, V.S.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.12.2002)

by Ho, J.P.Y., Yip, C.W.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.06.2003)

by Yip, C.W.Y., Ho, J.P.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.06.2003)

by KWOK, S. C. H, WAN, G. J, HO, J. P. Y, CHU, P. K, BILEK, M. M. M, MCKENZIE, D. R
Published in Surface & coatings technology (2007)