Experimental investigation of the impact of LWR on sub-100-nm device performance
Hyun-Woo Kim, Ji-Young Lee, Shin, J., Sang-Gyun Woo, Han-Ku Cho, Joo-Tae Moon
Published in IEEE transactions on electron devices (01.12.2004)
Published in IEEE transactions on electron devices (01.12.2004)
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Journal Article
Spatial Distribution of Interface Traps in Sub-50-nm Recess-Channel-Type DRAM Cell Transistors
CHUNG, Eun-Ae, KIM, Young-Pil, MOON, Joo-Tae, KIM, Sangsig, PARK, Min-Chul, NAM, Kab-Jin, LEE, Sung-Sam, MIN, Ji-Young, YANG, Giyoung, SHIN, Yu-Gyun, CHOI, Siyoung, JIN, Gyoyoung
Published in IEEE electron device letters (01.01.2011)
Published in IEEE electron device letters (01.01.2011)
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Journal Article
Characterization of threshold voltage instability after program in charge trap flash memory
Bio Kim, SeungJae Baik, Sunjung Kim, Joon-Gon Lee, Bonyoung Koo, Siyoung Choi, Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Effect of pre-existing void in sub-30nm Cu interconnect reliability
Zungsun Choi, Tsukasa, M, Jong Myeong Lee, Gil-Heyun Choi, Siyoung Choi, Joo-Tae Moon
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
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Conference Proceeding
Gate oxide effect on wafer level reliability of next generation dram transistors
Yu Gyun Shin, Kab-Jin Nam, Heedon Hwang, Jeong Hee Han, Sangjin Hyun, Siyoung Choi, Joo-Tae Moon
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
Electromigration tests for critical stress and failure mechanism evaluation in Cu/W via/Al hybrid interconnect
Zungsun Choi, Byung-Lyul Park, Jong Myeong Lee, Gil-Heyun Choi, Hyeon-Deok Lee, Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Electrical field dependence of data retention in high-k interpoly dielectrics
Chun-Hyung Chung, Seung-Hyun Lim, Sang-Wook Lim, Young-Sun Kim, Choi, S.Y., Joo-Tae Moon
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
State of the art technologies and future prospective in display industry
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Conference Proceeding
Improved Cell Performance for sub-50 nm DRAM with Manufacturable Bulk FinFET Structure
Deok-Hyung Lee, Sun-Ghil Lee, Jong Ryeol Yoo, Gyoung-Ho Buh, Guk Hyon Yon, Dong-Woon Shin, Dong Kyu Lee, Hyun-Sook Byun, In Soo Jung, Tai-su Park, Yu Gyun Shin, Siyoung Choi, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Leakage current mechanisms in sub-50 nm recess-channel-type DRAM cell transistors with three-terminal gate-controlled diodes
CHUNG, Eun-Ae, KIM, Young-Pil, NAM, Kab-Jin, LEE, Sungsam, MIN, Ji-Young, SHIN, Yu-Gyun, CHOI, Siyoung, JIN, Gyoyoung, MOON, Joo-Tae, KIM, Sangsig
Published in Solid-state electronics (01.02.2011)
Published in Solid-state electronics (01.02.2011)
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Journal Article
Body-tied triple-gate NMOSFET fabrication using bulk Si wafer
Park, Tai-su, Choi, Siyoung, Lee, Deok-Hyung, Chung, U-In, Moon, Joo Tae, Yoon, Euijoon, Lee, Jong-Ho
Published in Solid-state electronics (01.03.2005)
Published in Solid-state electronics (01.03.2005)
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Journal Article
Selective Epitaxial Growth of Silicon Layer Using Batch-Type Equipment for Vertical Diode Application to Next Generation Memories
Lee, Kong-Soo, Yoo, Dae-Han, Yoo, Young-Sub, Han, Jae-Jong, Kim, Seok-Sik, Jeong, Hong-Sik, Kang, Chang-Jin, Moon, Joo-Tae, Park, Hyunho, Jeong, Hanwook, Kim, Kwang-Ryul, Choi, Byoungdeog
Published in ECS transactions (01.01.2010)
Published in ECS transactions (01.01.2010)
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Journal Article
Investigation of Ni/Co bilayer salicidation process for sub-40 nm gate technology
Jung, Eun Ji, Jung, Sug-Woo, Kim, Hyun-Su, Yun, Jong-Ho, Cheong, Seong Hwee, Kim, Byung Hee, Choi, Gil Heyun, Kim, Sung Tae, Chung, U-In, Moon, Joo Tae, Ryu, Byung Il
Published in Microelectronic engineering (01.12.2005)
Published in Microelectronic engineering (01.12.2005)
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Journal Article
Conference Proceeding
A study on the Pt electrode etching for 0.15 μm technologies
Kim, Hyoun-Woo, Ju, Byong-Sun, Kang, Chang-Jin, Moon, Joo-Tae
Published in Microelectronic engineering (01.01.2003)
Published in Microelectronic engineering (01.01.2003)
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Journal Article
Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices
Lee, Jin-Wook, Buh, Gyoung Ho, Yon, Guk-Hyon, Park, Tai-su, Shin, Yu Gyun, Chung, U-In, Moon, Joo-Tae
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Semiconductor nanowires surrounded by cylindrical Al2O3 shells
MIN, Byungdon, JONG SOO LEE, LEE, Moon-Sook, SOON OH PARK, MOON, Joo-Tae, CHO, Kyoungah, JU WON HWANG, KIM, Hyunsuk, MAN YOUNG SUNG, KIM, Sangsig, PARK, Jeunghee, HEE WON SEO, SEUNG YONG BAE
Published in Journal of electronic materials (01.11.2003)
Published in Journal of electronic materials (01.11.2003)
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Journal Article
Comparison of electrical characteristics of back- and top-gate Si nanowire field-effect transistors
Changjoon Yoon, Kihyun Keem, Jeongmin Kang, Dong-Young Jeong, Moon-Sook Lee, In-Seok Yeo, U-In Chung, Joo-Tae Moon, Sangsig Kim
Published in 2006 IEEE Nanotechnology Materials and Devices Conference (01.10.2006)
Published in 2006 IEEE Nanotechnology Materials and Devices Conference (01.10.2006)
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Conference Proceeding
Improvement of Performance and Data Retention Characteristics of Sub-50nm DRAM by HfSiON Gate Dielectric
Sangjin Hyun, Hye-Min Kim, Hye-Lan Lee, Kab-Jin Nam, Sug-Hun Hong, Dong-Chan Kim, Jihyun Kim, Soo-Ik Jang, In Sang Jeon, Sangbom Kang, Siyoung Choi, U-In Chung, Joo-Tae Moon, Byung-Il Ryu
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
Reliability degradation of high density DRAM cell transistor junction leakage current induced by band-to-defect tunneling under the off-state bias-temperature stress
Young Pil Kim, Young Wook Park, Joo Tae Moon, Kim, S.U.
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)
Published in 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) (2001)
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Conference Proceeding
Systematic method to optimize conditioning process through real time plasma monitoring
Kye Hyun Baek, Yong Jin Kim, Gyung Jin Min, Chang Jin Kang, Han Ku Cho, Joo Tae Moon
Published in ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 (2005)
Published in ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 (2005)
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Conference Proceeding