Process stability of deuterium-annealed MOSFET's
Clark, W.F., Ference, T.G., Hook, T.B., Watson, K.M., Mittl, S.W., Burnham, J.S.
Published in IEEE electron device letters (01.01.1999)
Published in IEEE electron device letters (01.01.1999)
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Journal Article
The combined effects of deuterium anneals and deuterated barrier-nitride processing on hot-electron degradation in MOSFET's
Ference, T.G., Burnham, J.S., Clark, W.F., Hook, T.B., Mittl, S.W., Watson, K.M., Liang-Kai Kevin Han
Published in IEEE transactions on electron devices (01.04.1999)
Published in IEEE transactions on electron devices (01.04.1999)
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Journal Article
Characterization of amorphous silicon solar cell preparation processes by real time spectroscopic ellipsometry
Collins, R.W., Joohyun Koh, Yiwei Lu, Sangbo Kim, Burnham, J.S., Wronski, C.R.
Published in Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 (1996)
Published in Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 (1996)
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