Method for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said method
BLACHA, ARMIN UDO, BEHA, JOHANNES GEORG, CLAUBERG, ROLF, MOLLER, ROLF BERND GEORG, POHL, WOLFGANG DIETER,DR
Year of Publication 28.12.1988
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Year of Publication 28.12.1988
Patent