Search Results - "Cohen, Guy A" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Processing for overcoming extreme topography

Processing for overcoming extreme topography

by COHEN GUY A, GOMA SHERIF A, TREWHELLA JEANNINE M, CORDES STEVEN A, ROSNER JOANNA
Year of Publication 10.12.2013

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Patent

PROCESSING FOR OVERCOMING EXTREME TOPOGRAPHY

PROCESSING FOR OVERCOMING EXTREME TOPOGRAPHY

by COHEN GUY A, GOMA SHERIF A, TREWHELLA JEANNINE M, CORDES STEVEN A, ROSNER JOANNA
Year of Publication 02.06.2011

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Patent

Processing for overcoming extreme topography

Processing for overcoming extreme topography

by COHEN GUY A, GOMA SHERIF A, TREWHELLA JEANNINE M, CORDES STEVEN A, ROSNER JOANNA
Year of Publication 29.03.2011

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Patent

PROCESSING FOR OVERCOMING EXTREME TOPOGRAPHY

PROCESSING FOR OVERCOMING EXTREME TOPOGRAPHY

by COHEN GUY A, GOMA SHERIF A, TREWHELLA JEANNINE M, CORDES STEVEN A, ROSNER JOANNA
Year of Publication 03.12.2009

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Patent

Processing for overcoming extreme topography

Processing for overcoming extreme topography

by COHEN GUY A, GOMA SHERIF A, TREWHELLA JEANNINE M, CORDES STEVEN A, ROSNER JOANNA
Year of Publication 12.01.2006

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Patent

Imaging overlay metrology target and apparatus and method for measuring imaging overlay

Imaging overlay metrology target and apparatus and method for measuring imaging overlay

by COHEN, GUY
Year of Publication 01.12.2017

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Patent

Ferroelectric field effect transistor with nanowire core

Ferroelectric field effect transistor with nanowire core

by GONG NANBO, ANDO TAKASHI, COHEN GUY
Year of Publication 21.07.2023

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Patent

Transfer length phase change material (pcm)-based bridging unit

Transfer length phase change material (pcm)-based bridging unit

by GONG NANBO, ANDO TAKASHI, COHEN GUY M
Year of Publication 24.06.2022

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Patent

Imaging overlay metrology target and complimentary overlay metrology measurement system

Imaging overlay metrology target and complimentary overlay metrology measurement system

by COHEN, GUY
Year of Publication 01.11.2013

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Patent

Estimating amplitude and phase asymmetry in imaging technology for achieving high accuracy in overlay metrology

Estimating amplitude and phase asymmetry in imaging technology for achieving high accuracy in overlay metrology

by LEVINSKI, VLADIMIR, GUTMAN, NADAV, MARCIANO, TAL, PASKOVER, YURI, COHEN, GUY
Year of Publication 01.12.2021

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Patent

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

by LEVINSKI, VLADIMIR, KANDEL, DANIEL, COHEN, GUY
Year of Publication 21.07.2019

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Patent

Multi-layer topological interconnect with proximal doping layer

Multi-layer topological interconnect with proximal doping layer

by BAJPAI, UTKARSH, LANZILLO, NICHOLAS ANTHONY, CHEN, CHING-TZU, LAVOIE, CHRISTIAN, MARCHACK, NATHAN P, TODOROV, TEODOR KRASSIMIROV, KERNS, PETER, GUNAWAN, OKI, COHEN, GUY M
Year of Publication 01.04.2024

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Patent

Multi-layer topological interconnect with proximal doping layer

Multi-layer topological interconnect with proximal doping layer

by BAJPAI, UTKARSH, LANZILLO, NICHOLAS ANTHONY, CHEN, CHING-TZU, LAVOIE, CHRISTIAN, MARCHACK, NATHAN P, TODOROV, TEODOR KRASSIMIROV, KERNS, PETER, GUNAWAN, OKI, COHEN, GUY M
Year of Publication 21.03.2024

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Patent

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

by LEVINSKI, VLADIMIR, KANDEL, DANIEL, COHEN, GUY
Year of Publication 16.11.2018

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Patent

ESTIMATING AMPLITUDE AND PHASE ASYMMETRY IN IMAGING TECHNOLOGY FOR ACHIEVING HIGH ACCURACY IN OVERLAY METROLOGY

ESTIMATING AMPLITUDE AND PHASE ASYMMETRY IN IMAGING TECHNOLOGY FOR ACHIEVING HIGH ACCURACY IN OVERLAY METROLOGY

by PASKOVER YURI, LEVINSKI VLADIMIR, GUTMAN NADAV, MARCIANO TAL, COHEN GUY
Year of Publication 06.03.2020

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Patent

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

by LEVINSKI, VLADIMIR, KANDEL, DANIEL, COHEN, GUY
Year of Publication 21.05.2018

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Patent

Method and system for providing tool induced shift using a sub-sampling scheme

Method and system for providing tool induced shift using a sub-sampling scheme

by IZIKSON, PAVEL, COHEN, GUY
Year of Publication 11.07.2014

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Patent

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

by LEVINSKI, VLADIMIR, KANDEL, DANIEL, COHEN, GUY
Year of Publication 01.09.2017

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Patent

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

Multi-layer overlay metrology target and complimentary overlay metrology measurement systems

by LEVINSKI, VLADIMIR, KANDEL, DANIEL, COHEN, GUY
Year of Publication 11.07.2017

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Patent

Estimating amplitude and phase asymmetry in imaging technology for achieving high accuracy in overlay metrology

Estimating amplitude and phase asymmetry in imaging technology for achieving high accuracy in overlay metrology

by LEVINSKI, VLADIMIR, GUTMAN, NADAV, MARCIANO, TAL, PASKOVER, YURI, COHEN, GUY
Year of Publication 01.05.2019

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Patent