Fabrication of pseudo three-dimensional PADC cell culture substrates for dosimetric studies
Ng, C.K.M., Wong, M.Y.P., Lam, R.K.K., Ho, J.P.Y., Yu, K.N.
Published in Radiation measurements (01.12.2011)
Published in Radiation measurements (01.12.2011)
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Journal Article
Conference Proceeding
Effects of stirring on the bulk etch rate of CR-39 detector
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Journal Article
Conference Proceeding
Effects of stirring on the bulk etch rate of LR 115 detector
Yip, C.W.Y., Ho, J.P.Y., Koo, V.S.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.06.2003)
Published in Radiation measurements (01.06.2003)
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Journal Article
Non-destructive measurement of active-layer thickness of LR 115 SSNTD
Ng, F.M.F., Yip, C.W.Y., Ho, J.P.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.02.2004)
Published in Radiation measurements (01.02.2004)
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Journal Article
A fast method to measure the thickness of removed layer from etching of SSNTD based on EDXRF
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Journal Article
Conference Proceeding
Measurement of bulk etch rate of LR115 detector with atomic force microscopy
Ho, J.P.Y., Yip, C.W.Y., Koo, V.S.Y., Nikezic, D., Yu, K.N.
Published in Radiation measurements (01.12.2002)
Published in Radiation measurements (01.12.2002)
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Journal Article
Differentiation between tracks and damages in SSNTD under the atomic force microscope
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Journal Article
Conference Proceeding
Study of inhomogeneity in thickness of LR 115 detector with SEM and Form Talysurf
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Journal Article
Conference Proceeding