Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method
Dutta, Maitreya, Mandal, Saptarshi, Hathwar, Raghuraj, Fischer, Alec M., Koeck, Franz A. M., Nemanich, Robert J., Goodnick, Stephen M., Chowdhury, Srabanti
Published in IEEE electron device letters (01.04.2018)
Published in IEEE electron device letters (01.04.2018)
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