Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.
Published in IEEE transactions on nuclear science (01.06.1996)
Published in IEEE transactions on nuclear science (01.06.1996)
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Journal Article
Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)
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Conference Proceeding