Measurement of the error rate of single flux quantum circuits with high temperature superconductors
Ruck, B., Yonuk Chong, Dittmann, R., Engelhardt, A., Oelze, B., Sodtke, E., Siegel, M., Booij, W.E., Blamire, M.G.
Published in IEEE transactions on applied superconductivity (01.06.1999)
Published in IEEE transactions on applied superconductivity (01.06.1999)
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